Observation of interface trap reduction in fluoropolymer dielectric organic transistors by low-frequency noise spectroscopy

Wonjun Shin; Jihyun Shin; Jong Ho Lee; Hocheon Yoo; Sung Tae Lee

doi:10.1063/5.0146275

Observation of interface trap reduction in fluoropolymer dielectric organic transistors by low-frequency noise spectroscopy

Wonjun Shin
, Jihyun Shin
, Jong Ho Lee
, Hocheon Yoo
, Sung Tae Lee

Seoul National University
Gachon University
Ministry of Science and ICT
Hongik University

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

This study examines the low-frequency noise characteristics of the 2,7-dioctyl[1] benzothieno[3,2-b][1] benzothiophene organic thin-film transistor (OTFT) having a CYTOP dielectric layer. Specifically, the fabricated OTFT exhibits 1/f noise, and its behavior is explained via a carrier number fluctuation model. Additionally, the volume trap density (N_T) of the gate dielectric is quantitatively evaluated and compared with its counterpart having SiO₂ dielectric layer.

Original language	English
Article number	263506
Journal	Applied Physics Letters
Volume	122
Issue number	26
DOIs	https://doi.org/10.1063/5.0146275
State	Published - 26 Jun 2023
Externally published	Yes

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title = "Observation of interface trap reduction in fluoropolymer dielectric organic transistors by low-frequency noise spectroscopy",

abstract = "This study examines the low-frequency noise characteristics of the 2,7-dioctyl[1] benzothieno[3,2-b][1] benzothiophene organic thin-film transistor (OTFT) having a CYTOP dielectric layer. Specifically, the fabricated OTFT exhibits 1/f noise, and its behavior is explained via a carrier number fluctuation model. Additionally, the volume trap density (NT) of the gate dielectric is quantitatively evaluated and compared with its counterpart having SiO2 dielectric layer.",

author = "Wonjun Shin and Jihyun Shin and Lee, \{Jong Ho\} and Hocheon Yoo and Lee, \{Sung Tae\}",

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AU - Shin, Wonjun

AU - Shin, Jihyun

AU - Lee, Jong Ho

AU - Yoo, Hocheon

AU - Lee, Sung Tae

PY - 2023/6/26

Y1 - 2023/6/26

N2 - This study examines the low-frequency noise characteristics of the 2,7-dioctyl[1] benzothieno[3,2-b][1] benzothiophene organic thin-film transistor (OTFT) having a CYTOP dielectric layer. Specifically, the fabricated OTFT exhibits 1/f noise, and its behavior is explained via a carrier number fluctuation model. Additionally, the volume trap density (NT) of the gate dielectric is quantitatively evaluated and compared with its counterpart having SiO2 dielectric layer.

AB - This study examines the low-frequency noise characteristics of the 2,7-dioctyl[1] benzothieno[3,2-b][1] benzothiophene organic thin-film transistor (OTFT) having a CYTOP dielectric layer. Specifically, the fabricated OTFT exhibits 1/f noise, and its behavior is explained via a carrier number fluctuation model. Additionally, the volume trap density (NT) of the gate dielectric is quantitatively evaluated and compared with its counterpart having SiO2 dielectric layer.

UR - https://www.scopus.com/pages/publications/85164005015

U2 - 10.1063/5.0146275

DO - 10.1063/5.0146275

M3 - Article

AN - SCOPUS:85164005015

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VL - 122

JO - Applied Physics Letters

JF - Applied Physics Letters

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M1 - 263506

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Observation of interface trap reduction in fluoropolymer dielectric organic transistors by low-frequency noise spectroscopy

Abstract

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