Abstract
Novolac-based photoresists, widely utilized in i-line and broadband photolithography, rely on diazonaphthoquinone (DNQ) photoactive compounds to enable UV-patterned dissolution via photochemically generated carboxylic acids. While the dissolution mechanism is typically governed by enhanced base solubility following DNQ photolysis and phenolic deprotonation, a counterintuitive decrease in dissolution rate with increasing temperature has been repeatedly observed in an intermediate thermal window—manifesting as a negative activation energy. Previous models have attributed this phenomenon to enhanced photoactive compound–novolac complexation or temperature-induced disruption of phenolate–tetramethylammonium ion pairs. However, these explanations fall short of accounting for additional observations such as surface densification and anion-specific effects. In this study, we uncover a complementary mechanism in which rapid formation of phenolate and carboxylate species leads to hydration-shell collapse and a subsequent densification of the novolac matrix near its glass transition temperature. Through systematic spectroscopic analysis, we propose a unified model that incorporates molecular interactions, ion-pairing dynamics, and polymer network reorganization, providing a comprehensive framework for understanding temperature-dependent dissolution behavior in DNQ/novolac photoresists.
| Original language | English |
|---|---|
| Pages (from-to) | 1765-1770 |
| Number of pages | 6 |
| Journal | Macromolecular Research |
| Volume | 33 |
| Issue number | 12 |
| DOIs | |
| State | Published - Dec 2025 |
Keywords
- ATR-FTIR
- DNQ/novolac photoresist
- Dissolution
- Hydration shell
- Network densification
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