Modeling of temperature dependent contact resistance for analysis of ESD reliability
- Kwang Hoon Oh
- , Jung Hoon Chun
- , Kaustav Banerjee
- , Charvaka Duvvury
- , Robert W. Dutton
- Stanford University
- University of California at Santa Barbara
- Texas Instruments
Research output: Contribution to journal › Conference article › peer-review
8
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citations