TY - GEN
T1 - Minority carrier lifetime of thermal degradation in organic light emitting diode
AU - Park, Hyun Ae
AU - Choi, Byoung Seon
AU - Choi, Byoung Deog
PY - 2012
Y1 - 2012
N2 - Lifetime is one of the most important parameter that it is implied many information of device electrical characteristics directly. It can be estimated to using the degradation of luminance with accelerating the charge supply in the traditional method of display devices lifetime analyzing. It takes great deal of time and a lot of effort to measure the lifetime according to degradation effects. This plot reveals that minority carrier lifetime is dominant in the entire device life of organic light emitting diode (OLED). Forward current (I F) measured before switching, reverse current (I R) after switching, storage time (t s) and reverse recovery time (t rr) were measured by transient response to drive minority carrier lifetime (τ p). The device minority carrier lifetime 90ns and 121ns extracted from transient equation and 9μs to 12μs average storage time is obtained in RGB OLEDs, respectively. We have reported that comparing the minority carrier lifetime characteristics of OLED with red, green and blue general diode, the color emission material induced device lowering through the carrier behavior. Ultimately, using the optical measurement including luminance transition and whole lifetime, carrier lifetime correlated with degradation is elicited in this paper.
AB - Lifetime is one of the most important parameter that it is implied many information of device electrical characteristics directly. It can be estimated to using the degradation of luminance with accelerating the charge supply in the traditional method of display devices lifetime analyzing. It takes great deal of time and a lot of effort to measure the lifetime according to degradation effects. This plot reveals that minority carrier lifetime is dominant in the entire device life of organic light emitting diode (OLED). Forward current (I F) measured before switching, reverse current (I R) after switching, storage time (t s) and reverse recovery time (t rr) were measured by transient response to drive minority carrier lifetime (τ p). The device minority carrier lifetime 90ns and 121ns extracted from transient equation and 9μs to 12μs average storage time is obtained in RGB OLEDs, respectively. We have reported that comparing the minority carrier lifetime characteristics of OLED with red, green and blue general diode, the color emission material induced device lowering through the carrier behavior. Ultimately, using the optical measurement including luminance transition and whole lifetime, carrier lifetime correlated with degradation is elicited in this paper.
KW - minority carrier lifetime
KW - OLED
KW - reverse recovery
UR - https://www.scopus.com/pages/publications/84864253264
U2 - 10.1109/IMFEDK.2012.6218618
DO - 10.1109/IMFEDK.2012.6218618
M3 - Conference contribution
AN - SCOPUS:84864253264
SN - 9781467308359
T3 - IMFEDK 2012 - 2012 International Meeting for Future of Electron Devices, Kansai
SP - 134
EP - 135
BT - IMFEDK 2012 - 2012 International Meeting for Future of Electron Devices, Kansai
T2 - 10th International Meeting for Future of Electron Devices, Kansai, IMFEDK 2012
Y2 - 9 May 2012 through 11 May 2012
ER -