Abstract
Various fluoride films on a glass substrate were prepared and characterized to provide a seed layer for silicon (Si) film growth. The XRD analysis on CaF2/glass illustrated (220) preferential orientation and showed lattice mismatch less than 0.69% with Si. This paper demonstrates microcrystalline silicon (μc-Si) film growth at a low substrate temperature of 300°C by using a CaF2/glass substrate. The μc-Si films exhibited crystallization in (111) and (220) planes, grain size of 700 A, crystalline volume fraction over 65%, dark- and photo-conductivity ratio of 124, activation energy of 0.49 eV, and dark conductivity less than 4 × 10-7 S/cm.
| Original language | English |
|---|---|
| Title of host publication | Conference Record of the 28th IEEE Photovoltaic Specialists Conference - 2000 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 841-844 |
| Number of pages | 4 |
| ISBN (Electronic) | 0780357728 |
| DOIs | |
| State | Published - 2000 |
| Event | 28th IEEE Photovoltaic Specialists Conference, PVSC 2000 - Anchorage, United States Duration: 15 Sep 2000 → 22 Sep 2000 |
Publication series
| Name | Conference Record of the IEEE Photovoltaic Specialists Conference |
|---|---|
| Volume | 2000-January |
| ISSN (Print) | 0160-8371 |
Conference
| Conference | 28th IEEE Photovoltaic Specialists Conference, PVSC 2000 |
|---|---|
| Country/Territory | United States |
| City | Anchorage |
| Period | 15/09/00 → 22/09/00 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
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