Method of fault injection for medical device based on ISO 26262

Jong Doo Park; Chae Hong Yi; Key Ho Kwon; Jae Wook Jeon

doi:10.1109/ISCE.2014.6884360

Method of fault injection for medical device based on ISO 26262

Jong Doo Park, Chae Hong Yi, Key Ho Kwon, Jae Wook Jeon

Department of Semiconductor Systems Engineering

Sungkyunkwan University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

Today, Many industries are studying methods that enhance and measure dependability. Dependability measurement methods use fault injection to monitor the state of a system. A fault/error that occurs in an unexpected situation, giving rise to an extreme status, can be inspected. To obtain high Automotive Safety Integrity Level (ASIL) in automotive safety standard (ISO 26262), any system must be tested using fault injection technique. NASA standard (8719.13B) also recommends the fault injection test. In contrast, the medical device safety standard (ISO 14971) does not mention the fault injection test. In this paper, we compare the difference between two standards and introduce a method of fault injection in medical device.

Original language	English
Title of host publication	ISCE 2014 - 18th IEEE International Symposium on Consumer Electronics
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Print)	9781479945924
DOIs	https://doi.org/10.1109/ISCE.2014.6884360
State	Published - 2014
Event	18th IEEE International Symposium on Consumer Electronics, ISCE 2014 - Jeju, Korea, Republic of Duration: 22 Jun 2014 → 25 Jun 2014

Publication series

Name	Proceedings of the International Symposium on Consumer Electronics, ISCE

Conference

Conference	18th IEEE International Symposium on Consumer Electronics, ISCE 2014
Country/Territory	Korea, Republic of
City	Jeju
Period	22/06/14 → 25/06/14

Keywords

Fault injection
ISO 14971
ISO 26262

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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10.1109/ISCE.2014.6884360

Cite this

Park, J. D., Yi, C. H., Kwon, K. H., & Jeon, J. W. (2014). Method of fault injection for medical device based on ISO 26262. In ISCE 2014 - 18th IEEE International Symposium on Consumer Electronics Article 6884360 (Proceedings of the International Symposium on Consumer Electronics, ISCE). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISCE.2014.6884360

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title = "Method of fault injection for medical device based on ISO 26262",

abstract = "Today, Many industries are studying methods that enhance and measure dependability. Dependability measurement methods use fault injection to monitor the state of a system. A fault/error that occurs in an unexpected situation, giving rise to an extreme status, can be inspected. To obtain high Automotive Safety Integrity Level (ASIL) in automotive safety standard (ISO 26262), any system must be tested using fault injection technique. NASA standard (8719.13B) also recommends the fault injection test. In contrast, the medical device safety standard (ISO 14971) does not mention the fault injection test. In this paper, we compare the difference between two standards and introduce a method of fault injection in medical device.",

keywords = "Fault injection, ISO 14971, ISO 26262",

author = "Park, \{Jong Doo\} and Yi, \{Chae Hong\} and Kwon, \{Key Ho\} and Jeon, \{Jae Wook\}",

year = "2014",

doi = "10.1109/ISCE.2014.6884360",

language = "English",

isbn = "9781479945924",

series = "Proceedings of the International Symposium on Consumer Electronics, ISCE",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "ISCE 2014 - 18th IEEE International Symposium on Consumer Electronics",

note = "18th IEEE International Symposium on Consumer Electronics, ISCE 2014 ; Conference date: 22-06-2014 Through 25-06-2014",

}

Park, JD, Yi, CH, Kwon, KH & Jeon, JW 2014, Method of fault injection for medical device based on ISO 26262. in ISCE 2014 - 18th IEEE International Symposium on Consumer Electronics., 6884360, Proceedings of the International Symposium on Consumer Electronics, ISCE, Institute of Electrical and Electronics Engineers Inc., 18th IEEE International Symposium on Consumer Electronics, ISCE 2014, Jeju, Korea, Republic of, 22/06/14. https://doi.org/10.1109/ISCE.2014.6884360

Method of fault injection for medical device based on ISO 26262. / Park, Jong Doo; Yi, Chae Hong; Kwon, Key Ho et al.
ISCE 2014 - 18th IEEE International Symposium on Consumer Electronics. Institute of Electrical and Electronics Engineers Inc., 2014. 6884360 (Proceedings of the International Symposium on Consumer Electronics, ISCE).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Method of fault injection for medical device based on ISO 26262

AU - Park, Jong Doo

AU - Yi, Chae Hong

AU - Kwon, Key Ho

AU - Jeon, Jae Wook

PY - 2014

Y1 - 2014

N2 - Today, Many industries are studying methods that enhance and measure dependability. Dependability measurement methods use fault injection to monitor the state of a system. A fault/error that occurs in an unexpected situation, giving rise to an extreme status, can be inspected. To obtain high Automotive Safety Integrity Level (ASIL) in automotive safety standard (ISO 26262), any system must be tested using fault injection technique. NASA standard (8719.13B) also recommends the fault injection test. In contrast, the medical device safety standard (ISO 14971) does not mention the fault injection test. In this paper, we compare the difference between two standards and introduce a method of fault injection in medical device.

AB - Today, Many industries are studying methods that enhance and measure dependability. Dependability measurement methods use fault injection to monitor the state of a system. A fault/error that occurs in an unexpected situation, giving rise to an extreme status, can be inspected. To obtain high Automotive Safety Integrity Level (ASIL) in automotive safety standard (ISO 26262), any system must be tested using fault injection technique. NASA standard (8719.13B) also recommends the fault injection test. In contrast, the medical device safety standard (ISO 14971) does not mention the fault injection test. In this paper, we compare the difference between two standards and introduce a method of fault injection in medical device.

KW - Fault injection

KW - ISO 14971

KW - ISO 26262

UR - https://www.scopus.com/pages/publications/84907319194

U2 - 10.1109/ISCE.2014.6884360

DO - 10.1109/ISCE.2014.6884360

M3 - Conference contribution

AN - SCOPUS:84907319194

SN - 9781479945924

T3 - Proceedings of the International Symposium on Consumer Electronics, ISCE

BT - ISCE 2014 - 18th IEEE International Symposium on Consumer Electronics

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 18th IEEE International Symposium on Consumer Electronics, ISCE 2014

Y2 - 22 June 2014 through 25 June 2014

ER -

Method of fault injection for medical device based on ISO 26262

Abstract

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Conference

Keywords

UN SDGs

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