Abstract
We present a novel metal-insulator-semiconductor (MIS) diode consisting of graphene, hexagonal BN, and monolayer MoS2 for application in ultrathin nanoelectronics. The MIS heterojunction structure was fabricated by vertically stacking layered materials using a simple wet chemical transfer method. The stacking of each layer was confirmed by confocal scanning Raman spectroscopy and device performance was evaluated using current versus voltage (I-V) and photocurrent measurements. We clearly observed better current rectification and much higher current flow in the MIS diode than in the p-n junction and the metal-semiconductor diodes made of layered materials. The I-V characteristic curve of the MIS diode indicates that current flows mainly across interfaces as a result of carrier tunneling. Moreover, we observed considerably high photocurrent from the MIS diode under visible light illumination.
| Original language | English |
|---|---|
| Pages (from-to) | 1858-1862 |
| Number of pages | 5 |
| Journal | Nano Letters |
| Volume | 16 |
| Issue number | 3 |
| DOIs | |
| State | Published - 9 Mar 2016 |
Keywords
- carrier tunneling
- Graphene
- h-BN
- metal-insulator-semiconductor diode
- monolayer MoS
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