Mechanical reliability evaluation of Sn-37Pb solder joint using high speed lap-shear test

Seong jae Jeon, Seungmin Hyun, Hak Joo Lee, Jong Woong Kim, Sang Su Ha, Jeong Won Yoon, Seung Boo Jung, Hoo Jeong Lee

Research output: Contribution to journalArticlepeer-review

25 Scopus citations

Abstract

This study utilized a high speed lap-shear test to evaluate the mechanical behavior of Sn-37Pb/Cu under bump metallization (UBM) solder joints under high speed loading and hence the drop reliability. The samples were aged for 120 h at different temperatures (150 °S{cyrillic}, 180 °S{cyrillic}) and then tested at different displacement rates in the range of 0.01 mm/s to 500 mm/s to examine the effects of aging on the drop reliability. The combination of the stress-strain graphs captured from the shear tests and the fracture morphology analysis discloses that the aging at high temperatures has influenced critically the deformation behavior of the solder joints and the effects appears more significant at high strain rates. This study demonstrates a unique capability of a drop reliability evaluation method that utilizes a high speed lap-shear test.

Original languageEnglish
Pages (from-to)1967-1970
Number of pages4
JournalMicroelectronic Engineering
Volume85
Issue number10
DOIs
StatePublished - Oct 2008

Keywords

  • Drop test
  • Fracture morphology
  • Lap-shear test
  • Sn-37Pb

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