Localized charge transfer reactions near the Pt-YSZ interfaces using Kelvin probe microscopy

Localized charge transfer reactions induced by the external bias were observed near the electrode-electrolyte interfaces by Kevin probe microscopy. Spatially resolved potential measurements revealed the localized charge accumulation and rearrangement driven by the external bias, which were ascribed to oxidation and reduction of the oxide surface. This in situ measurement of charge distribution with spatial information under controlled environments can be particularly useful in investigating the charge transfer reactions on the surfaces of functional materials and enhance our understanding of many electronic and electrochemical devices.