Local electrical characteristics of dielectrophoretically deposited carbon nanotubes

Huiseong Jeong; Hosung Kang; Seunghyun Baik; Ji Yong Park

doi:10.1166/jnn.2011.3398

Local electrical characteristics of dielectrophoretically deposited carbon nanotubes

Huiseong Jeong, Hosung Kang, Seunghyun Baik, Ji Yong Park

Department of Mechanical Engineering

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

Electrostatic force microscopy and scanning gate microscopy are employed to investigate the local electrical characteristics of single-walled carbon nanotube (SWCNT) devices that are fabricated by alternating current dielectrophoresis with high spatial resolutions. The results show good electrical anchoring of nanotubes to electrodes and absence of local gate dependence as well as global gate dependence while device resistance can be dominated by contact resistances among bundles of SWCNTs.

Original language	English
Pages (from-to)	1791-1794
Number of pages	4
Journal	Journal of Nanoscience and Nanotechnology
Volume	11
Issue number	2
DOIs	https://doi.org/10.1166/jnn.2011.3398
State	Published - Feb 2011

Keywords

Carbon nanotube
Dielectrophoresis
Scanning probe microscopy

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10.1166/jnn.2011.3398

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title = "Local electrical characteristics of dielectrophoretically deposited carbon nanotubes",

abstract = "Electrostatic force microscopy and scanning gate microscopy are employed to investigate the local electrical characteristics of single-walled carbon nanotube (SWCNT) devices that are fabricated by alternating current dielectrophoresis with high spatial resolutions. The results show good electrical anchoring of nanotubes to electrodes and absence of local gate dependence as well as global gate dependence while device resistance can be dominated by contact resistances among bundles of SWCNTs.",

keywords = "Carbon nanotube, Dielectrophoresis, Scanning probe microscopy",

author = "Huiseong Jeong and Hosung Kang and Seunghyun Baik and Park, \{Ji Yong\}",

year = "2011",

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doi = "10.1166/jnn.2011.3398",

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AU - Jeong, Huiseong

AU - Kang, Hosung

AU - Baik, Seunghyun

AU - Park, Ji Yong

PY - 2011/2

Y1 - 2011/2

N2 - Electrostatic force microscopy and scanning gate microscopy are employed to investigate the local electrical characteristics of single-walled carbon nanotube (SWCNT) devices that are fabricated by alternating current dielectrophoresis with high spatial resolutions. The results show good electrical anchoring of nanotubes to electrodes and absence of local gate dependence as well as global gate dependence while device resistance can be dominated by contact resistances among bundles of SWCNTs.

AB - Electrostatic force microscopy and scanning gate microscopy are employed to investigate the local electrical characteristics of single-walled carbon nanotube (SWCNT) devices that are fabricated by alternating current dielectrophoresis with high spatial resolutions. The results show good electrical anchoring of nanotubes to electrodes and absence of local gate dependence as well as global gate dependence while device resistance can be dominated by contact resistances among bundles of SWCNTs.

KW - Carbon nanotube

KW - Dielectrophoresis

KW - Scanning probe microscopy

UR - https://www.scopus.com/pages/publications/84863040786

U2 - 10.1166/jnn.2011.3398

DO - 10.1166/jnn.2011.3398

M3 - Article

AN - SCOPUS:84863040786

SN - 1533-4880

VL - 11

SP - 1791

EP - 1794

JO - Journal of Nanoscience and Nanotechnology

JF - Journal of Nanoscience and Nanotechnology

IS - 2

ER -

Local electrical characteristics of dielectrophoretically deposited carbon nanotubes

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Keywords

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