Load line analysis of Bi-2223 tape-stacked-cable for self field effects

Wansoo Nah; Hoon Hwangbo; Junghee Ye; Jinho Joo; Hyun Man Jang; Hong Soo Ha; Sang Soo Oh; Young Kil Kwon; Myung Hwan Sohn; Kang Sik Ryu

doi:10.1109/77.828439

Load line analysis of Bi-2223 tape-stacked-cable for self field effects

Wansoo Nah
, Hoon Hwangbo
, Junghee Ye
, Jinho Joo
, Hyun Man Jang
, Hong Soo Ha
, Sang Soo Oh
, Young Kil Kwon
, Myung Hwan Sohn
, Kang Sik Ryu

Department of Advanced Materials Science and Engineering

Research output: Contribution to journal › Conference article › peer-review

8 Scopus citations

Abstract

In general, the critical current of a Bi-2223 tape-stacked-cable is much less than the total summation of critical currents of each tape, which is mainly due to the self magnetic fields of the cable itself. Therefore, to predict the critical current of a Bi-2223 tape-stacked-cable, we need to analyze the self field effects of the stacked cable as well as the critical current density data (J_c) of one tape. To make it more complex, the critical current degradation of a Bi-2223 tape is anisotropic; the critical current is lower in the normal magnetic field (to the tape surface) than in the parallel field. In this paper, a novel approach to predict the critical current of a Bi-2223 tape-stacked-cable from a J_c-B curve of one tape is presented. The approach basically includes the load line analysis of the stacked tapes, and its usefulness is confirmed by the experimental data.

Original language	English
Pages (from-to)	1158-1161
Number of pages	4
Journal	IEEE Transactions on Applied Superconductivity
Volume	10
Issue number	1
DOIs	https://doi.org/10.1109/77.828439
State	Published - 2000
Event	The 16th International Conference on Magnet Tehnolopgy - Tallahassee, FL, USA Duration: 26 Sep 1999 → 2 Oct 1999

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10.1109/77.828439

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title = "Load line analysis of Bi-2223 tape-stacked-cable for self field effects",

abstract = "In general, the critical current of a Bi-2223 tape-stacked-cable is much less than the total summation of critical currents of each tape, which is mainly due to the self magnetic fields of the cable itself. Therefore, to predict the critical current of a Bi-2223 tape-stacked-cable, we need to analyze the self field effects of the stacked cable as well as the critical current density data (Jc) of one tape. To make it more complex, the critical current degradation of a Bi-2223 tape is anisotropic; the critical current is lower in the normal magnetic field (to the tape surface) than in the parallel field. In this paper, a novel approach to predict the critical current of a Bi-2223 tape-stacked-cable from a Jc-B curve of one tape is presented. The approach basically includes the load line analysis of the stacked tapes, and its usefulness is confirmed by the experimental data.",

author = "Wansoo Nah and Hoon Hwangbo and Junghee Ye and Jinho Joo and Jang, \{Hyun Man\} and Ha, \{Hong Soo\} and Oh, \{Sang Soo\} and Kwon, \{Young Kil\} and Sohn, \{Myung Hwan\} and Ryu, \{Kang Sik\}",

year = "2000",

doi = "10.1109/77.828439",

language = "English",

volume = "10",

pages = "1158--1161",

journal = "IEEE Transactions on Applied Superconductivity",

issn = "1051-8223",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "1",

note = "The 16th International Conference on Magnet Tehnolopgy ; Conference date: 26-09-1999 Through 02-10-1999",

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TY - JOUR

T1 - Load line analysis of Bi-2223 tape-stacked-cable for self field effects

AU - Nah, Wansoo

AU - Hwangbo, Hoon

AU - Ye, Junghee

AU - Joo, Jinho

AU - Jang, Hyun Man

AU - Ha, Hong Soo

AU - Oh, Sang Soo

AU - Kwon, Young Kil

AU - Sohn, Myung Hwan

AU - Ryu, Kang Sik

PY - 2000

Y1 - 2000

N2 - In general, the critical current of a Bi-2223 tape-stacked-cable is much less than the total summation of critical currents of each tape, which is mainly due to the self magnetic fields of the cable itself. Therefore, to predict the critical current of a Bi-2223 tape-stacked-cable, we need to analyze the self field effects of the stacked cable as well as the critical current density data (Jc) of one tape. To make it more complex, the critical current degradation of a Bi-2223 tape is anisotropic; the critical current is lower in the normal magnetic field (to the tape surface) than in the parallel field. In this paper, a novel approach to predict the critical current of a Bi-2223 tape-stacked-cable from a Jc-B curve of one tape is presented. The approach basically includes the load line analysis of the stacked tapes, and its usefulness is confirmed by the experimental data.

AB - In general, the critical current of a Bi-2223 tape-stacked-cable is much less than the total summation of critical currents of each tape, which is mainly due to the self magnetic fields of the cable itself. Therefore, to predict the critical current of a Bi-2223 tape-stacked-cable, we need to analyze the self field effects of the stacked cable as well as the critical current density data (Jc) of one tape. To make it more complex, the critical current degradation of a Bi-2223 tape is anisotropic; the critical current is lower in the normal magnetic field (to the tape surface) than in the parallel field. In this paper, a novel approach to predict the critical current of a Bi-2223 tape-stacked-cable from a Jc-B curve of one tape is presented. The approach basically includes the load line analysis of the stacked tapes, and its usefulness is confirmed by the experimental data.

UR - https://www.scopus.com/pages/publications/0033905974

U2 - 10.1109/77.828439

DO - 10.1109/77.828439

M3 - Conference article

AN - SCOPUS:0033905974

SN - 1051-8223

VL - 10

SP - 1158

EP - 1161

JO - IEEE Transactions on Applied Superconductivity

JF - IEEE Transactions on Applied Superconductivity

IS - 1

T2 - The 16th International Conference on Magnet Tehnolopgy

Y2 - 26 September 1999 through 2 October 1999

ER -

Load line analysis of Bi-2223 tape-stacked-cable for self field effects

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