Lateral redistribution of trapped charges in nitride/oxide/Si (NOS) investigated by electrostatic force microscopy
- Seung Jae Baik
- , Koeng Su Lim
- , Wonsup Choi
- , Hyunjun Yoo
- , Jang Sik Lee
- , Hyunjung Shin
- Korea Advanced Institute of Science and Technology
- Kookmin University
Research output: Contribution to journal › Article › peer-review
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