LaAlOx/Al2O3 gate insulator for amorphous InGaZnO TFTs to suppress permittivity scattering of lanthanum oxide

Research output: Contribution to journalConference articlepeer-review

Abstract

Although lanthanum oxide has a high dielectric constant, it is not suitable as a gate insulator for TFTs due to its hygroscopic property. To suppress this, we propose a fabrication of a LaAlOx/Al2O3 gate insulator by aluminum doping and adding Al2O3 barrier on lanthanum oxide.

Original languageEnglish
Pages (from-to)238-240
Number of pages3
JournalProceedings of the International Display Workshops
Volume27
StatePublished - 9 Dec 2021
Externally publishedYes
Event27th International Display Workshops, IDW 2020 - Virtual, Online
Duration: 9 Dec 202011 Dec 2020

Keywords

  • A-IGZO TFTs
  • High-k
  • LaAlOx/Al2O3

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