@inproceedings{3b9be3ff7b6e4375bcd04b00d838f10c,
title = "Investigation on output driver with stacked devices for ESD design window engineering",
abstract = "This work investigates the ESD robustness of stacked drivers in bulk and SOI technologies. The impact of stacked driver sizing and pre-driver connection is examined in detail using VF-TLP and TLP measurement. It is shown that proper pre-driver configuration can double Vt2, thereby improving I/O's It2.",
author = "Shuqing Cao and Chun, \{Jung Hoon\} and Eunji Choi and Stephen Beebe and Warren Anderson and Robert Dutton",
year = "2010",
language = "English",
isbn = "1585371823",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010, EOS/ESD 2010",
note = "32nd Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2010 ; Conference date: 03-10-2010 Through 08-10-2010",
}