Initial Growth Behavior in Catalyst-Free-Grown Vertical ZnO Nanorods on c-Al2O3, as Observed Using Synchrotron Radiation X-ray Scattering

Hongseok Oh; Young Joon Hong; Gyu Chul Yi; Hyeonjun Baek; Dong Ryeol Lee; Hyun Hwi Lee

doi:10.1021/acs.cgd.2c00959

Initial Growth Behavior in Catalyst-Free-Grown Vertical ZnO Nanorods on c-Al₂O₃, as Observed Using Synchrotron Radiation X-ray Scattering

Hongseok Oh, Young Joon Hong, Gyu Chul Yi, Hyeonjun Baek, Dong Ryeol Lee, Hyun Hwi Lee

Research output: Contribution to journal › Article › peer-review

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Abstract

In this study, synchrotron radiation X-ray diffraction analysis is used to investigate the initial growth dynamics of metal-organic vapor-phase epitaxy-grown ZnO nanorods on c-Al₂O₃ substrates. A two-dimensional area detector with a grazing-incidence geometry enables projected reciprocal space mapping (RSM) using coordinate transformation of diffraction images. The projected RSM reveals multiple heteroepitaxial relationships between ZnO and Al₂O₃, including the dominant relationship of ZnO(101̅0)∥Al₂O₃(21̅1̅0). Evolution of internal strain is revealed by an additional study on diffraction images and θ-2θ scans. Surface topology from atomic force microscopy estimates the growth rate, supported by the Scherrer equation analysis of the θ-2θ diffraction.

Original language	English
Pages (from-to)	1434-1441
Number of pages	8
Journal	Crystal Growth and Design
Volume	23
Issue number	3
DOIs	https://doi.org/10.1021/acs.cgd.2c00959
State	Published - 1 Mar 2023
Externally published	Yes

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title = "Initial Growth Behavior in Catalyst-Free-Grown Vertical ZnO Nanorods on c-Al2O3, as Observed Using Synchrotron Radiation X-ray Scattering",

abstract = "In this study, synchrotron radiation X-ray diffraction analysis is used to investigate the initial growth dynamics of metal-organic vapor-phase epitaxy-grown ZnO nanorods on c-Al2O3 substrates. A two-dimensional area detector with a grazing-incidence geometry enables projected reciprocal space mapping (RSM) using coordinate transformation of diffraction images. The projected RSM reveals multiple heteroepitaxial relationships between ZnO and Al2O3, including the dominant relationship of ZnO(101̅0)∥Al2O3(21̅1̅0). Evolution of internal strain is revealed by an additional study on diffraction images and θ-2θ scans. Surface topology from atomic force microscopy estimates the growth rate, supported by the Scherrer equation analysis of the θ-2θ diffraction.",

author = "Hongseok Oh and Hong, \{Young Joon\} and Yi, \{Gyu Chul\} and Hyeonjun Baek and Lee, \{Dong Ryeol\} and Lee, \{Hyun Hwi\}",

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year = "2023",

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doi = "10.1021/acs.cgd.2c00959",

language = "English",

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AU - Oh, Hongseok

AU - Hong, Young Joon

AU - Yi, Gyu Chul

AU - Baek, Hyeonjun

AU - Lee, Dong Ryeol

AU - Lee, Hyun Hwi

PY - 2023/3/1

Y1 - 2023/3/1

N2 - In this study, synchrotron radiation X-ray diffraction analysis is used to investigate the initial growth dynamics of metal-organic vapor-phase epitaxy-grown ZnO nanorods on c-Al2O3 substrates. A two-dimensional area detector with a grazing-incidence geometry enables projected reciprocal space mapping (RSM) using coordinate transformation of diffraction images. The projected RSM reveals multiple heteroepitaxial relationships between ZnO and Al2O3, including the dominant relationship of ZnO(101̅0)∥Al2O3(21̅1̅0). Evolution of internal strain is revealed by an additional study on diffraction images and θ-2θ scans. Surface topology from atomic force microscopy estimates the growth rate, supported by the Scherrer equation analysis of the θ-2θ diffraction.

AB - In this study, synchrotron radiation X-ray diffraction analysis is used to investigate the initial growth dynamics of metal-organic vapor-phase epitaxy-grown ZnO nanorods on c-Al2O3 substrates. A two-dimensional area detector with a grazing-incidence geometry enables projected reciprocal space mapping (RSM) using coordinate transformation of diffraction images. The projected RSM reveals multiple heteroepitaxial relationships between ZnO and Al2O3, including the dominant relationship of ZnO(101̅0)∥Al2O3(21̅1̅0). Evolution of internal strain is revealed by an additional study on diffraction images and θ-2θ scans. Surface topology from atomic force microscopy estimates the growth rate, supported by the Scherrer equation analysis of the θ-2θ diffraction.

UR - https://www.scopus.com/pages/publications/85147209408

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DO - 10.1021/acs.cgd.2c00959

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JO - Crystal Growth and Design

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IS - 3

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Initial Growth Behavior in Catalyst-Free-Grown Vertical ZnO Nanorods on c-Al₂O₃, as Observed Using Synchrotron Radiation X-ray Scattering

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