Improving productivity through reducing MBT application time using internal bad block management DFT

Hyun Sung; Moon Bo Shim; Jin Sung Jung; Young Ik Eom

doi:10.1149/07233.0047ecst

Improving productivity through reducing MBT application time using internal bad block management DFT

Hyun Sung, Moon Bo Shim, Jin Sung Jung, Young Ik Eom

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Recently, storage market has been shifting from hard disk to SSD, and the importance of NAND flash memory, which plays a key role as a storage media in the SSD, is also increasing. Accordingly, in the manufacturing phase, the test cost of NAND flash memory is getting larger as the density of NAND flash memory is increasing. In this paper, we propose a scheme for DFT(Design for Testability) that can reduce the NAND flash test cost and apply it to the actual MBT(Monitoring Burn-in Test) manufacturing process to prove improvements in the manufacturing cost.

Original language	English
Title of host publication	General Society Student Poster Session
Editors	V. Subramanian, V. Chaitanya, K. Sundaram, P. Pharkya
Publisher	Electrochemical Society Inc.
Pages	47-52
Number of pages	6
Edition	33
ISBN (Electronic)	9781607687603
ISBN (Print)	9781623324025
DOIs	https://doi.org/10.1149/07233.0047ecst
State	Published - 2016
Externally published	Yes
Event	General Society Student Poster Session - 229th ECS Meeting - San Diego, United States Duration: 29 May 2016 → 2 Jun 2016

Publication series

Name	ECS Transactions
Number	33
Volume	72
ISSN (Print)	1938-6737
ISSN (Electronic)	1938-5862

Conference

Conference	General Society Student Poster Session - 229th ECS Meeting
Country/Territory	United States
City	San Diego
Period	29/05/16 → 2/06/16

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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10.1149/07233.0047ecst

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Sung, H., Shim, M. B., Jung, J. S., & Eom, Y. I. (2016). Improving productivity through reducing MBT application time using internal bad block management DFT. In V. Subramanian, V. Chaitanya, K. Sundaram, & P. Pharkya (Eds.), General Society Student Poster Session (33 ed., pp. 47-52). (ECS Transactions; Vol. 72, No. 33). Electrochemical Society Inc.. https://doi.org/10.1149/07233.0047ecst

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title = "Improving productivity through reducing MBT application time using internal bad block management DFT",

abstract = "Recently, storage market has been shifting from hard disk to SSD, and the importance of NAND flash memory, which plays a key role as a storage media in the SSD, is also increasing. Accordingly, in the manufacturing phase, the test cost of NAND flash memory is getting larger as the density of NAND flash memory is increasing. In this paper, we propose a scheme for DFT(Design for Testability) that can reduce the NAND flash test cost and apply it to the actual MBT(Monitoring Burn-in Test) manufacturing process to prove improvements in the manufacturing cost.",

author = "Hyun Sung and Shim, \{Moon Bo\} and Jung, \{Jin Sung\} and Eom, \{Young Ik\}",

note = "Publisher Copyright: {\textcopyright} 2016 The Electrochemical Society.; General Society Student Poster Session - 229th ECS Meeting ; Conference date: 29-05-2016 Through 02-06-2016",

year = "2016",

doi = "10.1149/07233.0047ecst",

language = "English",

isbn = "9781623324025",

series = "ECS Transactions",

publisher = "Electrochemical Society Inc.",

number = "33",

pages = "47--52",

editor = "V. Subramanian and V. Chaitanya and K. Sundaram and P. Pharkya",

booktitle = "General Society Student Poster Session",

edition = "33",

}

Sung, H, Shim, MB, Jung, JS & Eom, YI 2016, Improving productivity through reducing MBT application time using internal bad block management DFT. in V Subramanian, V Chaitanya, K Sundaram & P Pharkya (eds), General Society Student Poster Session. 33 edn, ECS Transactions, no. 33, vol. 72, Electrochemical Society Inc., pp. 47-52, General Society Student Poster Session - 229th ECS Meeting, San Diego, United States, 29/05/16. https://doi.org/10.1149/07233.0047ecst

Improving productivity through reducing MBT application time using internal bad block management DFT. / Sung, Hyun; Shim, Moon Bo; Jung, Jin Sung et al.
General Society Student Poster Session. ed. / V. Subramanian; V. Chaitanya; K. Sundaram; P. Pharkya. 33. ed. Electrochemical Society Inc., 2016. p. 47-52 (ECS Transactions; Vol. 72, No. 33).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Shim, Moon Bo

AU - Jung, Jin Sung

AU - Eom, Young Ik

PY - 2016

Y1 - 2016

N2 - Recently, storage market has been shifting from hard disk to SSD, and the importance of NAND flash memory, which plays a key role as a storage media in the SSD, is also increasing. Accordingly, in the manufacturing phase, the test cost of NAND flash memory is getting larger as the density of NAND flash memory is increasing. In this paper, we propose a scheme for DFT(Design for Testability) that can reduce the NAND flash test cost and apply it to the actual MBT(Monitoring Burn-in Test) manufacturing process to prove improvements in the manufacturing cost.

AB - Recently, storage market has been shifting from hard disk to SSD, and the importance of NAND flash memory, which plays a key role as a storage media in the SSD, is also increasing. Accordingly, in the manufacturing phase, the test cost of NAND flash memory is getting larger as the density of NAND flash memory is increasing. In this paper, we propose a scheme for DFT(Design for Testability) that can reduce the NAND flash test cost and apply it to the actual MBT(Monitoring Burn-in Test) manufacturing process to prove improvements in the manufacturing cost.

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U2 - 10.1149/07233.0047ecst

DO - 10.1149/07233.0047ecst

M3 - Conference contribution

AN - SCOPUS:85010843438

SN - 9781623324025

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A2 - Subramanian, V.

A2 - Chaitanya, V.

A2 - Sundaram, K.

A2 - Pharkya, P.

PB - Electrochemical Society Inc.

T2 - General Society Student Poster Session - 229th ECS Meeting

Y2 - 29 May 2016 through 2 June 2016

ER -

Improving productivity through reducing MBT application time using internal bad block management DFT

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