Improvement of mechanical reliability by patterned silver/Indium-Tin-Oxide structure for flexible electronic devices
- Kyunghyun Baek
- , Kyungsoo Jang
- , Youn Jung Lee
- , Kyungyul Ryu
- , Woojin Choi
- , Doyoung Kim
- , Junsin Yi
Research output: Contribution to journal › Article › peer-review
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