Improvement of characteristics in highly reliable thin film diode with anodic tantalum pentoxide by low temperature annealing conditions
- Chan Jae Lee
- , Sung Jei Hong
- , Sung Kyu Park
- , Yong Hoon Kim
- , Min Gi Kwak
- , Won Keun Kim
- , Jeong In Han
- Korea Electronics Technology Institute
Research output: Contribution to journal › Conference article › peer-review