Improvement in power efficiency in organic light emitting diodes through intermediate Mg:Ag layer in Li/FMg:Ag/Al cathodes

Sung Hyun Kim; Jyongsik Jang; Jun Yeob Lee

doi:10.1149/1.2756337

Improvement in power efficiency in organic light emitting diodes through intermediate Mg:Ag layer in Li/FMg:Ag/Al cathodes

Sung Hyun Kim
, Jyongsik Jang
, Jun Yeob Lee

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

Effects of Mg:Ag interlayer between LiF and Al on electron injection and device performances of organic light-emitting diodes (OLEDs) were investigated. Thickness of Mg:Ag layer was changed from 0 to 10 nm and the relationship between interlayer thickness and device performances was studied. Current density of OLEDs was increased due to efficient electron injection from cathode to organic layer by Mg:Ag interlayer. In addition, power efficiency of OLEDs was improved by more than 50% due to low driving voltage and high recombination efficiency and it showed a maximum value at a Mg:Ag thickness of 1.0 nm.

Original language	English
Pages (from-to)	J117-J119
Journal	Electrochemical and Solid-State Letters
Volume	10
Issue number	10
DOIs	https://doi.org/10.1149/1.2756337
State	Published - 2007
Externally published	Yes

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This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 7 Affordable and Clean Energy

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10.1149/1.2756337

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title = "Improvement in power efficiency in organic light emitting diodes through intermediate Mg:Ag layer in Li/FMg:Ag/Al cathodes",

abstract = "Effects of Mg:Ag interlayer between LiF and Al on electron injection and device performances of organic light-emitting diodes (OLEDs) were investigated. Thickness of Mg:Ag layer was changed from 0 to 10 nm and the relationship between interlayer thickness and device performances was studied. Current density of OLEDs was increased due to efficient electron injection from cathode to organic layer by Mg:Ag interlayer. In addition, power efficiency of OLEDs was improved by more than 50\% due to low driving voltage and high recombination efficiency and it showed a maximum value at a Mg:Ag thickness of 1.0 nm.",

author = "Kim, \{Sung Hyun\} and Jyongsik Jang and Lee, \{Jun Yeob\}",

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language = "English",

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T1 - Improvement in power efficiency in organic light emitting diodes through intermediate Mg:Ag layer in Li/FMg:Ag/Al cathodes

AU - Kim, Sung Hyun

AU - Jang, Jyongsik

AU - Lee, Jun Yeob

PY - 2007

Y1 - 2007

N2 - Effects of Mg:Ag interlayer between LiF and Al on electron injection and device performances of organic light-emitting diodes (OLEDs) were investigated. Thickness of Mg:Ag layer was changed from 0 to 10 nm and the relationship between interlayer thickness and device performances was studied. Current density of OLEDs was increased due to efficient electron injection from cathode to organic layer by Mg:Ag interlayer. In addition, power efficiency of OLEDs was improved by more than 50% due to low driving voltage and high recombination efficiency and it showed a maximum value at a Mg:Ag thickness of 1.0 nm.

AB - Effects of Mg:Ag interlayer between LiF and Al on electron injection and device performances of organic light-emitting diodes (OLEDs) were investigated. Thickness of Mg:Ag layer was changed from 0 to 10 nm and the relationship between interlayer thickness and device performances was studied. Current density of OLEDs was increased due to efficient electron injection from cathode to organic layer by Mg:Ag interlayer. In addition, power efficiency of OLEDs was improved by more than 50% due to low driving voltage and high recombination efficiency and it showed a maximum value at a Mg:Ag thickness of 1.0 nm.

UR - https://www.scopus.com/pages/publications/34547841457

U2 - 10.1149/1.2756337

DO - 10.1149/1.2756337

M3 - Article

AN - SCOPUS:34547841457

SN - 1099-0062

VL - 10

SP - J117-J119

JO - Electrochemical and Solid-State Letters

JF - Electrochemical and Solid-State Letters

IS - 10

ER -

Improvement in power efficiency in organic light emitting diodes through intermediate Mg:Ag layer in Li/FMg:Ag/Al cathodes

Abstract

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