Improvement in bias stress reliability by barrier thickness variation in GaN based light-emitting diodes
- Bo Hyun Kong
- , Hyung Koun Cho
- , Sung Hoon Jung
- , Jong Pil Jeong
- , Seon Ho Lee
- , Sang Hyun Lee
- , Sung Jin Son
- , Myeong Seok Oh
- Sungkyunkwan University
- LG Corporation
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