High performance and transparent multilayer MoS2 transistors: Tuning Schottky barrier characteristics

  • Young Ki Hong
  • , Geonwook Yoo
  • , Junyeon Kwon
  • , Seongin Hong
  • , Won Geun Song
  • , Na Liu
  • , Inturu Omkaram
  • , Byungwook Yoo
  • , Sanghyun Ju
  • , Sunkook Kim
  • , Min Suk Oh

Research output: Contribution to journalArticlepeer-review

Abstract

Various strategies and mechanisms have been suggested for investigating a Schottky contact behavior in molybdenum disulfide (MoS2) thin-film transistor (TFT), which are still in much debate and controversy. As one of promising breakthrough for transparent electronics with a high device performance, we have realized MoS2 TFTs with source/drain electrodes consisting of transparent bi-layers of a conducting oxide over a thin film of low work function metal. Intercalation of a low work function metal layer, such as aluminum, between MoS2 and transparent source/drain electrodes makes it possible to optimize the Schottky contact characteristics, resulting in about 24-fold and 3 orders of magnitude enhancement of the field-effect mobility and on-off current ratio, respectively, as well as transmittance of 87.4 % in the visible wavelength range.

Original languageEnglish
Article number055026
JournalAIP Advances
Volume6
Issue number5
DOIs
StatePublished - 1 May 2016
Externally publishedYes

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