TY - GEN
T1 - High-mobility 2D layered semiconducting transistors based on large-area and highly crystalline CVD-grown MoSe2 for flexible electronics
AU - Hong, Seongin
AU - Kim, Seung Min
AU - Song, Won Geun
AU - Hong, Youngki
AU - Kim, Sunkook
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/9/27
Y1 - 2016/9/27
N2 - Layered semiconductor materials of molecular thickness, in particular transition metal dichacholgenides (TMDs), possess desirable characteristics including the existence of bandgap, low-power switching behavior, and high carrier mobility that afford them promising as active components of future high speed and low-power electronics[1-3]. Reliable large-volume production of 2D layered semiconductors is an essential step for translating their intriguing properties into applications. Although atomically thin flakes of 2D layered TMD such as MoS2 can be peeled from bulk crystals by micromechanical exfoliation, this method is not integrated in large-volume and does not allow systematic control of thickness and size of 2D layered semiconductors. Hence, the growth of large-area MoS2 is one of the critical challenges to realize its promising potential.[4]
AB - Layered semiconductor materials of molecular thickness, in particular transition metal dichacholgenides (TMDs), possess desirable characteristics including the existence of bandgap, low-power switching behavior, and high carrier mobility that afford them promising as active components of future high speed and low-power electronics[1-3]. Reliable large-volume production of 2D layered semiconductors is an essential step for translating their intriguing properties into applications. Although atomically thin flakes of 2D layered TMD such as MoS2 can be peeled from bulk crystals by micromechanical exfoliation, this method is not integrated in large-volume and does not allow systematic control of thickness and size of 2D layered semiconductors. Hence, the growth of large-area MoS2 is one of the critical challenges to realize its promising potential.[4]
UR - https://www.scopus.com/pages/publications/84994796814
U2 - 10.1109/SNW.2016.7577983
DO - 10.1109/SNW.2016.7577983
M3 - Conference contribution
AN - SCOPUS:84994796814
T3 - 2016 IEEE Silicon Nanoelectronics Workshop, SNW 2016
SP - 56
EP - 57
BT - 2016 IEEE Silicon Nanoelectronics Workshop, SNW 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 21st IEEE Silicon Nanoelectronics Workshop, SNW 2016
Y2 - 12 June 2016 through 13 June 2016
ER -