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High current density field emission device from directly grown planar graphene via PECVD

  • Bom Lee
  • , Sooheon Cho
  • , Eunju Hong
  • , Giwon Lee
  • , Byungkee Lee
  • , Yeong Hyeop Kim
  • , Donggwan Ryoo
  • , Byung Joo Jeong
  • , Dahoon Kim
  • , Jinsu Kang
  • , Chen Chen Wang
  • , Ji Hee Kim
  • , Hak Ki Yu
  • , Jae Young Choi
  • Sungkyunkwan University
  • LG Corporation
  • Pusan National University
  • Ajou University

Research output: Contribution to journalArticlepeer-review

Abstract

We present a stable and efficient field electron emission device based on planar graphene directly grown on SiO 2/Si substrates using plasma-enhanced chemical vapor deposition (PECVD). The PECVD process carried out in a hydrogen-rich environment at low temperature effectively lowers the work function through doping effects, while the defect states formed during low-temperature synthesis induce local field enhancement. These factors act synergistically to enable stable Fowler-Nordheim tunneling and reliable device operation. The transfer-free, catalyst-free process ensures high reproducibility, and the resulting device exhibits a low turn-on voltage of 7.5 V. Remarkably, the single-cell device achieved an emission current density of 400 mA/cm2, while the 5 × 5 array cell device reached 300 mA/cm2, both of which significantly exceed values reported for previously studied planar graphene-based emitters. These findings demonstrate that planar graphene is a promising material platform for scalable, low-power vacuum electronic applications.

Original languageEnglish
Article number164748
JournalApplied Surface Science
Volume717
DOIs
StatePublished - 1 Feb 2026

Keywords

  • Field electron emission (FEE)
  • Fowler-Nordheim tunneling
  • Graphene-oxide-semiconductor (GOS)
  • Metal-oxide-semiconductor (MOS)
  • Planar graphene
  • Plasma-enhanced chemical vapor deposition (PECVD)

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