Abstract
We present a stable and efficient field electron emission device based on planar graphene directly grown on SiO 2/Si substrates using plasma-enhanced chemical vapor deposition (PECVD). The PECVD process carried out in a hydrogen-rich environment at low temperature effectively lowers the work function through doping effects, while the defect states formed during low-temperature synthesis induce local field enhancement. These factors act synergistically to enable stable Fowler-Nordheim tunneling and reliable device operation. The transfer-free, catalyst-free process ensures high reproducibility, and the resulting device exhibits a low turn-on voltage of 7.5 V. Remarkably, the single-cell device achieved an emission current density of 400 mA/cm2, while the 5 × 5 array cell device reached 300 mA/cm2, both of which significantly exceed values reported for previously studied planar graphene-based emitters. These findings demonstrate that planar graphene is a promising material platform for scalable, low-power vacuum electronic applications.
| Original language | English |
|---|---|
| Article number | 164748 |
| Journal | Applied Surface Science |
| Volume | 717 |
| DOIs | |
| State | Published - 1 Feb 2026 |
Keywords
- Field electron emission (FEE)
- Fowler-Nordheim tunneling
- Graphene-oxide-semiconductor (GOS)
- Metal-oxide-semiconductor (MOS)
- Planar graphene
- Plasma-enhanced chemical vapor deposition (PECVD)