High current density field emission device from directly grown planar graphene via PECVD

Bom Lee, Sooheon Cho, Eunju Hong, Giwon Lee, Byungkee Lee, Yeong Hyeop Kim, Donggwan Ryoo, Byung Joo Jeong, Dahoon Kim, Jinsu Kang, Chen Chen Wang, Ji Hee Kim, Hak Ki Yu, Jae Young Choi

Research output: Contribution to journalArticlepeer-review

Abstract

We present a stable and efficient field electron emission device based on planar graphene directly grown on SiO 2/Si substrates using plasma-enhanced chemical vapor deposition (PECVD). The PECVD process carried out in a hydrogen-rich environment at low temperature effectively lowers the work function through doping effects, while the defect states formed during low-temperature synthesis induce local field enhancement. These factors act synergistically to enable stable Fowler-Nordheim tunneling and reliable device operation. The transfer-free, catalyst-free process ensures high reproducibility, and the resulting device exhibits a low turn-on voltage of 7.5 V. Remarkably, the single-cell device achieved an emission current density of 400 mA/cm2, while the 5 × 5 array cell device reached 300 mA/cm2, both of which significantly exceed values reported for previously studied planar graphene-based emitters. These findings demonstrate that planar graphene is a promising material platform for scalable, low-power vacuum electronic applications.

Original languageEnglish
Article number164748
JournalApplied Surface Science
Volume717
DOIs
StatePublished - 1 Feb 2026

Keywords

  • Field electron emission (FEE)
  • Fowler-Nordheim tunneling
  • Graphene-oxide-semiconductor (GOS)
  • Metal-oxide-semiconductor (MOS)
  • Planar graphene
  • Plasma-enhanced chemical vapor deposition (PECVD)

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