Growth and Properties of Completely Amorphous Vanadium Oxide Cathode Thin Film with Pt Co-Sputtering Method

Han Ki Kim; Tae Yeon Seong; S. M. Lee; Young Soo Yoon

doi:10.1007/BF03027269

Growth and Properties of Completely Amorphous Vanadium Oxide Cathode Thin Film with Pt Co-Sputtering Method

Han Ki Kim, Tae Yeon Seong, S. M. Lee, Young Soo Yoon

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

The effect of Pt co-sputtering on the characteristics of amorphous V ₂O₅ films, grown by dc reactive sputtering, was investigated using glancing angle x-ray diffraction (GXRD), transmission electron microscopy (TEM), transmission electron diffraction (TED) and charge-discharge measurement. It was found that the Pt co-sputtering processes influence the growth mechanism as well as the characteristics of V ₂O₅ films. In addition, it was found that the Pt co-sputtered V₂O₅ cathode film exhibits cyclibility better than the undoped V₂O₅ cathode film, due to the absence of short range order, which is generally shown in undoped V₂O ₅ cathode films. Possible explanations for the cycling behavior of the Pt doped V₂O₅ cathode film and Pt co-sputtering effect on the electrochemical properties of thin film batteries are suggested.

Original language	English
Pages (from-to)	135-140
Number of pages	6
Journal	Metals and Materials International
Volume	9
Issue number	2
DOIs	https://doi.org/10.1007/BF03027269
State	Published - Apr 2003
Externally published	Yes

Keywords

Cathode
Pt co-sputtering
Short-range order
Thin film batteries
Transmission electron microscopy (TEM)
VO

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10.1007/BF03027269

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title = "Growth and Properties of Completely Amorphous Vanadium Oxide Cathode Thin Film with Pt Co-Sputtering Method",

abstract = "The effect of Pt co-sputtering on the characteristics of amorphous V 2O5 films, grown by dc reactive sputtering, was investigated using glancing angle x-ray diffraction (GXRD), transmission electron microscopy (TEM), transmission electron diffraction (TED) and charge-discharge measurement. It was found that the Pt co-sputtering processes influence the growth mechanism as well as the characteristics of V 2O5 films. In addition, it was found that the Pt co-sputtered V2O5 cathode film exhibits cyclibility better than the undoped V2O5 cathode film, due to the absence of short range order, which is generally shown in undoped V2O 5 cathode films. Possible explanations for the cycling behavior of the Pt doped V2O5 cathode film and Pt co-sputtering effect on the electrochemical properties of thin film batteries are suggested.",

keywords = "Cathode, Pt co-sputtering, Short-range order, Thin film batteries, Transmission electron microscopy (TEM), VO",

author = "Kim, \{Han Ki\} and Seong, \{Tae Yeon\} and Lee, \{S. M.\} and Yoon, \{Young Soo\}",

year = "2003",

month = apr,

doi = "10.1007/BF03027269",

language = "English",

volume = "9",

pages = "135--140",

journal = "Metals and Materials International",

issn = "1598-9623",

publisher = "Korean Institute of Metals and Materials",

number = "2",

}

TY - JOUR

T1 - Growth and Properties of Completely Amorphous Vanadium Oxide Cathode Thin Film with Pt Co-Sputtering Method

AU - Kim, Han Ki

AU - Seong, Tae Yeon

AU - Lee, S. M.

AU - Yoon, Young Soo

PY - 2003/4

Y1 - 2003/4

N2 - The effect of Pt co-sputtering on the characteristics of amorphous V 2O5 films, grown by dc reactive sputtering, was investigated using glancing angle x-ray diffraction (GXRD), transmission electron microscopy (TEM), transmission electron diffraction (TED) and charge-discharge measurement. It was found that the Pt co-sputtering processes influence the growth mechanism as well as the characteristics of V 2O5 films. In addition, it was found that the Pt co-sputtered V2O5 cathode film exhibits cyclibility better than the undoped V2O5 cathode film, due to the absence of short range order, which is generally shown in undoped V2O 5 cathode films. Possible explanations for the cycling behavior of the Pt doped V2O5 cathode film and Pt co-sputtering effect on the electrochemical properties of thin film batteries are suggested.

AB - The effect of Pt co-sputtering on the characteristics of amorphous V 2O5 films, grown by dc reactive sputtering, was investigated using glancing angle x-ray diffraction (GXRD), transmission electron microscopy (TEM), transmission electron diffraction (TED) and charge-discharge measurement. It was found that the Pt co-sputtering processes influence the growth mechanism as well as the characteristics of V 2O5 films. In addition, it was found that the Pt co-sputtered V2O5 cathode film exhibits cyclibility better than the undoped V2O5 cathode film, due to the absence of short range order, which is generally shown in undoped V2O 5 cathode films. Possible explanations for the cycling behavior of the Pt doped V2O5 cathode film and Pt co-sputtering effect on the electrochemical properties of thin film batteries are suggested.

KW - Cathode

KW - Pt co-sputtering

KW - Short-range order

KW - Thin film batteries

KW - Transmission electron microscopy (TEM)

KW - VO

UR - https://www.scopus.com/pages/publications/1842577629

U2 - 10.1007/BF03027269

DO - 10.1007/BF03027269

M3 - Article

AN - SCOPUS:1842577629

SN - 1598-9623

VL - 9

SP - 135

EP - 140

JO - Metals and Materials International

JF - Metals and Materials International

IS - 2

ER -

Growth and Properties of Completely Amorphous Vanadium Oxide Cathode Thin Film with Pt Co-Sputtering Method

Abstract

Keywords

UN SDGs

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