Growth and characterization of ultrathin Pt films on Cu(111)

U. Schröder, R. Linke, J. H. Boo, K. Wandelt

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17 Scopus citations

Abstract

The growth of ultrathin Pt films on the Cu(111) surface has been investigated in the temperature range 100-500 K. Different Pt coverages between 0.1 and 2.0 ML are obtained by thermal evaporation of Pt atoms. Auger data show a layer-by-layer growth of Pt for the first two monolayers at room temperature. Moreover, the Pt films are stable below 500 K and Xe-TDS can be used as a good probe for the determination of the Pt monolayer completion. Below monolayer coverages the Xe-TD peak maximum is shifted continuously to the high temperature sides by up to 100 K while remaining constant at higher coverages. CO-TDS from Cu(111) with submonolayer Pt coverages shows that CO adsorbs in two different states attributed to CO on Pt and Cu sites. The desorption temperature of CO on Pt sites is decreased by as much as about 100 K compared to pure Pt due to the influence of the Cu substrate. HREELS results and work function measurements are used to determine the CO adsorption sites.

Original languageEnglish
Pages (from-to)873-878
Number of pages6
JournalSurface Science
Volume357-358
DOIs
StatePublished - 20 Jun 1996
Externally publishedYes

Keywords

  • Carbon monoxide
  • Copper
  • Electron energy loss spectroscopy
  • Platinum
  • Thermal desorption spectroscopy
  • Thin films
  • Work function measurements
  • Xenon

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