Growth and characteristics of Zn:LiNbO3/Mg:LiNbO3 multilayer thin films grown by liquid phase epitaxy

H. J. Lee; T. I. Shin; J. W. Shur; D. H. Yoon

doi:10.1002/crat.200510682

Growth and characteristics of Zn:LiNbO₃/Mg:LiNbO₃ multilayer thin films grown by liquid phase epitaxy

H. J. Lee
, T. I. Shin
, J. W. Shur
, D. H. Yoon

Department of Advanced Materials Science and Engineering

Sungkyunkwan University

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

1, 3 and 5 mol% ZnO doped LiNbO₃ film and 2 mol% MgO doped LiNbO₃ multilayer films were grown on the LiNbO₃ (001) substrate by liquid phase epitaxy (LPE) method with a Li₂O-V ₂O₅ system. We examined the optical transmission spectra of the Zn:LiNbO₃ by Fourier Transform-Infrared Spectrophotometer (FT-IR). The crystallinity and the lattice mismatch between the Zn:LiNbO ₃ film and Mg:LiNbO₃ film was confirmed by x-ray rocking curve (XRC) and observed the ZnO and MgO distribution in the cross-section of the multilayer thin films by electron probe micro analyzer (EPMA). Furthermore, the surface morphology of the films was observed using atomic force microscopy (AFM).

Original language	English
Pages (from-to)	848-852
Number of pages	5
Journal	Crystal Research and Technology
Volume	41
Issue number	9
DOIs	https://doi.org/10.1002/crat.200510682
State	Published - Sep 2006

Keywords

Epitaxial layer
LiNbO
LPE method
Photorefractive effect

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10.1002/crat.200510682

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@article{4648c67210d343a8bd6912c40ae521df,

title = "Growth and characteristics of Zn:LiNbO3/Mg:LiNbO3 multilayer thin films grown by liquid phase epitaxy",

abstract = "1, 3 and 5 mol\% ZnO doped LiNbO3 film and 2 mol\% MgO doped LiNbO3 multilayer films were grown on the LiNbO3 (001) substrate by liquid phase epitaxy (LPE) method with a Li2O-V 2O5 system. We examined the optical transmission spectra of the Zn:LiNbO3 by Fourier Transform-Infrared Spectrophotometer (FT-IR). The crystallinity and the lattice mismatch between the Zn:LiNbO 3 film and Mg:LiNbO3 film was confirmed by x-ray rocking curve (XRC) and observed the ZnO and MgO distribution in the cross-section of the multilayer thin films by electron probe micro analyzer (EPMA). Furthermore, the surface morphology of the films was observed using atomic force microscopy (AFM).",

keywords = "Epitaxial layer, LiNbO, LPE method, Photorefractive effect",

author = "Lee, \{H. J.\} and Shin, \{T. I.\} and Shur, \{J. W.\} and Yoon, \{D. H.\}",

year = "2006",

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doi = "10.1002/crat.200510682",

language = "English",

volume = "41",

pages = "848--852",

journal = "Crystal Research and Technology",

issn = "0232-1300",

publisher = "John Wiley \& Sons Inc.",

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TY - JOUR

T1 - Growth and characteristics of Zn:LiNbO3/Mg:LiNbO3 multilayer thin films grown by liquid phase epitaxy

AU - Lee, H. J.

AU - Shin, T. I.

AU - Shur, J. W.

AU - Yoon, D. H.

PY - 2006/9

Y1 - 2006/9

N2 - 1, 3 and 5 mol% ZnO doped LiNbO3 film and 2 mol% MgO doped LiNbO3 multilayer films were grown on the LiNbO3 (001) substrate by liquid phase epitaxy (LPE) method with a Li2O-V 2O5 system. We examined the optical transmission spectra of the Zn:LiNbO3 by Fourier Transform-Infrared Spectrophotometer (FT-IR). The crystallinity and the lattice mismatch between the Zn:LiNbO 3 film and Mg:LiNbO3 film was confirmed by x-ray rocking curve (XRC) and observed the ZnO and MgO distribution in the cross-section of the multilayer thin films by electron probe micro analyzer (EPMA). Furthermore, the surface morphology of the films was observed using atomic force microscopy (AFM).

AB - 1, 3 and 5 mol% ZnO doped LiNbO3 film and 2 mol% MgO doped LiNbO3 multilayer films were grown on the LiNbO3 (001) substrate by liquid phase epitaxy (LPE) method with a Li2O-V 2O5 system. We examined the optical transmission spectra of the Zn:LiNbO3 by Fourier Transform-Infrared Spectrophotometer (FT-IR). The crystallinity and the lattice mismatch between the Zn:LiNbO 3 film and Mg:LiNbO3 film was confirmed by x-ray rocking curve (XRC) and observed the ZnO and MgO distribution in the cross-section of the multilayer thin films by electron probe micro analyzer (EPMA). Furthermore, the surface morphology of the films was observed using atomic force microscopy (AFM).

KW - Epitaxial layer

KW - LiNbO

KW - LPE method

KW - Photorefractive effect

UR - https://www.scopus.com/pages/publications/33748496671

U2 - 10.1002/crat.200510682

DO - 10.1002/crat.200510682

M3 - Article

AN - SCOPUS:33748496671

SN - 0232-1300

VL - 41

SP - 848

EP - 852

JO - Crystal Research and Technology

JF - Crystal Research and Technology

IS - 9

ER -

Growth and characteristics of Zn:LiNbO₃/Mg:LiNbO₃ multilayer thin films grown by liquid phase epitaxy

Abstract

Keywords

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