Graphene oxide thin film field effect transistors without reduction

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Abstract

Pristine graphene oxide thin film field effect transistors were fabricated on Si substrates without an additional reduction process. Graphene oxide with an optical band gap of 1.7 eV showed p-type semiconducting behaviour in air and ambipolarity under vacuum. The temperature dependence of conductance confirmed these semiconducting characteristics. I-V characteristics were well fitted to a variable range hopping model with 2 + 3 dimensionality, in good contrast to the 2D fitting in the reduced graphene oxide.

Original languageEnglish
Article number135109
JournalJournal of Physics D: Applied Physics
Volume42
Issue number13
DOIs
StatePublished - 2009
Externally publishedYes

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