Skip to main navigation Skip to search Skip to main content

Grain boundary Josephson junctions created by bi-epitaxial processes

  • K. Char
  • , M. S. Colclough
  • , L. P. Lee
  • , G. Zaharchuk
  • Conductus, Inc.

Research output: Contribution to journalArticlepeer-review

Abstract

We describe a "bi-epitaxial" process to create 45 degree grain boundary Josephson junctions in YBa2Cu3O7. These bi-epitaxial grain boundary Josephson junctions are defined by standard photolithographic technique, and appear to be readily extended to integrated circuits. Some transport properties are reported and compared to other types of grain boundary Josephson junctions.

Original languageEnglish
Pages (from-to)2561-2562
Number of pages2
JournalPhysica C: Superconductivity and its Applications
Volume185-189
Issue numberPART 4
DOIs
StatePublished - 1 Dec 1991
Externally publishedYes

Fingerprint

Dive into the research topics of 'Grain boundary Josephson junctions created by bi-epitaxial processes'. Together they form a unique fingerprint.

Cite this