TY - JOUR
T1 - Front-side metal electrode optimization using fine line double screen printing and nickel plating for large area crystalline silicon solar cells
AU - Park, Cheolmin
AU - Kwon, Taeyoung
AU - Kim, Bonggi
AU - Lee, Jonghwan
AU - Ahn, Shihyun
AU - Ju, Minkyu
AU - Balaji, Nagarajan
AU - Lee, Hoongjoo
AU - Yi, Junsin
PY - 2012/10
Y1 - 2012/10
N2 - Industrial applicable fine-line double printing and nickel plating method was applied to single crystalline silicon (c-Si) solar cells. As the finger widths decreased, the efficiency and short circuit current density (J SC) linearly increased. Although the increase of the J SC was caused by the reduction of shadowing loss due to the decrease of finger width, the fill factor (FF) was slowly decreased due to increase of contact resistance. The FF of the cells using the fine line was enhanced by using a double printing and nickel plating. c-Si solar cells with the dimensions of 12.5 cm × 12.5 cm, double printed finger width of 50 μm due to spreadability of paste, a finger spacing of 2.4 μm, and aluminum back surface field were fabricated, achieving an increase of J SC and efficiencies of up to about 0.62 mA/cm 2 and 0.38% compared to a reference cell at 79.8% of the FF, respectively.
AB - Industrial applicable fine-line double printing and nickel plating method was applied to single crystalline silicon (c-Si) solar cells. As the finger widths decreased, the efficiency and short circuit current density (J SC) linearly increased. Although the increase of the J SC was caused by the reduction of shadowing loss due to the decrease of finger width, the fill factor (FF) was slowly decreased due to increase of contact resistance. The FF of the cells using the fine line was enhanced by using a double printing and nickel plating. c-Si solar cells with the dimensions of 12.5 cm × 12.5 cm, double printed finger width of 50 μm due to spreadability of paste, a finger spacing of 2.4 μm, and aluminum back surface field were fabricated, achieving an increase of J SC and efficiencies of up to about 0.62 mA/cm 2 and 0.38% compared to a reference cell at 79.8% of the FF, respectively.
KW - A. Intermetallic compounds
KW - A. Metals
KW - A. Semiconductors
KW - D. Electrical properties
UR - https://www.scopus.com/pages/publications/84866340139
U2 - 10.1016/j.materresbull.2012.04.105
DO - 10.1016/j.materresbull.2012.04.105
M3 - Article
AN - SCOPUS:84866340139
SN - 0025-5408
VL - 47
SP - 3027
EP - 3031
JO - Materials Research Bulletin
JF - Materials Research Bulletin
IS - 10
ER -