TY - JOUR
T1 - Frequency-Dependent Variation of LeTID Degradation and Recovery Using Low Intensity with Different AC Biasing in TOPCon Solar Cells
AU - Rahman, Rafi Ur
AU - Jony, Jaljalalul Abedin
AU - Alamgeer,
AU - Yousuf, Hasnain
AU - Khokhar, Muhammad Quddamah
AU - Aida, Maha Nur
AU - Chu, Mengmeng
AU - Mohammed, Alwuheeshi Shurouq Abdulqadir
AU - Park, Sangheon
AU - Yi, Junsin
N1 - Publisher Copyright:
© The Author(s) 2025.
PY - 2025/9
Y1 - 2025/9
N2 - The efficiency and reliability of photovoltaic technologies are essential for the global transition to sustainable energy systems. Tunnel oxide passive contact (TOPCon) solar cells have gained prominence due to their high conversion efficiency and improved long-term performance. Light and elevated temperature-induced degradation (LeTID) poses a significant challenge, reducing efficiency and operational stability. Research has primarily focused on understanding the underlying mechanisms of LeTID and developing mitigation strategies. The role of alternating current (AC) biasing waveforms remains underexplored, particularly under varying frequencies. We investigated the effects of sinusoidal, square, and triangular AC waveforms at frequencies of 100 kHz, 500 kHz, and 1 MHz on the performance recovery of 4 × 4 cm2 TOPCon solar cells degraded under 0.5-sun illumination at 85°C for 11 h. Regeneration was conducted for 2 h using a peak-to-peak voltage (Vpp) of 1.4 V. Square and sinusoidal waveforms at 500 kHz and 1 MHz achieved the highest recovery across all key parameters. Triangular waveforms, although effective, demonstrated slightly lower recovery, particularly at lower frequencies. The findings highlight the importance of waveform characteristics and frequency in mitigating LeTID effects. Future work will optimize waveform parameters, such as amplitude and duty cycle, to maximize regeneration efficiency. Long-term field tests will validate these methods' applicability under real-world operating conditions, ensuring the durability and stability of TOPCon solar cells in large-scale deployments.
AB - The efficiency and reliability of photovoltaic technologies are essential for the global transition to sustainable energy systems. Tunnel oxide passive contact (TOPCon) solar cells have gained prominence due to their high conversion efficiency and improved long-term performance. Light and elevated temperature-induced degradation (LeTID) poses a significant challenge, reducing efficiency and operational stability. Research has primarily focused on understanding the underlying mechanisms of LeTID and developing mitigation strategies. The role of alternating current (AC) biasing waveforms remains underexplored, particularly under varying frequencies. We investigated the effects of sinusoidal, square, and triangular AC waveforms at frequencies of 100 kHz, 500 kHz, and 1 MHz on the performance recovery of 4 × 4 cm2 TOPCon solar cells degraded under 0.5-sun illumination at 85°C for 11 h. Regeneration was conducted for 2 h using a peak-to-peak voltage (Vpp) of 1.4 V. Square and sinusoidal waveforms at 500 kHz and 1 MHz achieved the highest recovery across all key parameters. Triangular waveforms, although effective, demonstrated slightly lower recovery, particularly at lower frequencies. The findings highlight the importance of waveform characteristics and frequency in mitigating LeTID effects. Future work will optimize waveform parameters, such as amplitude and duty cycle, to maximize regeneration efficiency. Long-term field tests will validate these methods' applicability under real-world operating conditions, ensuring the durability and stability of TOPCon solar cells in large-scale deployments.
KW - AC waveform frequency techniques
KW - electrical parameters
KW - LeTID
KW - photovoltaic defect passivation
KW - silicon solar cell
UR - https://www.scopus.com/pages/publications/105009633650
U2 - 10.1007/s11664-025-12043-x
DO - 10.1007/s11664-025-12043-x
M3 - Article
AN - SCOPUS:105009633650
SN - 0361-5235
VL - 54
SP - 7308
EP - 7320
JO - Journal of Electronic Materials
JF - Journal of Electronic Materials
IS - 9
ER -