(formula presented) characteristic measurements to study the nature of the vortex state and dissipation in (formula presented) thin films

S. K. Gupta; Shashwati Sen; Ajay Singh; D. K. Aswal; J. V. Yakhmi; Eun Mi Choi; Hyun Jung Kim; Kijoon H.P. Kim; Seungje Choi; Hyun Sook Lee; W. N. Kang; Sung Ik Lee

doi:10.1103/PhysRevB.66.104525

(formula presented) characteristic measurements to study the nature of the vortex state and dissipation in (formula presented) thin films

S. K. Gupta, Shashwati Sen, Ajay Singh, D. K. Aswal, J. V. Yakhmi, Eun Mi Choi, Hyun Jung Kim, Kijoon H.P. Kim, Seungje Choi, Hyun Sook Lee, W. N. Kang, Sung Ik Lee

Research output: Contribution to journal › Article › peer-review

Abstract

The temperature dependence of current-voltage (formula presented) thin films has been studied at different magnetic fields (H) and angles (formula presented) show critical scaling indicative of vortex glass transition. The critical exponents are found to be independent of H and (formula presented) indicating a universal behavior. The scaling functions are also seen to be field and angle independent when resistivity and current density are normalized with two parameters (formula presented) Field and angle dependences of parameters (formula presented) and vortex glass transition temperature (formula presented) are seen to be in agreement with the anisotropic Ginzburg-Landau model.

Original language	English
Pages (from-to)	1-5
Number of pages	5
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	66
Issue number	10
DOIs	https://doi.org/10.1103/PhysRevB.66.104525
State	Published - 2002
Externally published	Yes

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Gupta, S. K., Sen, S., Singh, A., Aswal, D. K., Yakhmi, J. V., Choi, E. M., Kim, H. J., Kim, K. H. P., Choi, S., Lee, H. S., Kang, W. N., & Lee, S. I. (2002). (formula presented) characteristic measurements to study the nature of the vortex state and dissipation in (formula presented) thin films. Physical Review B - Condensed Matter and Materials Physics, 66(10), 1-5. https://doi.org/10.1103/PhysRevB.66.104525

@article{d6f404a5a3bd474a9054ef3063441e94,

title = "(formula presented) characteristic measurements to study the nature of the vortex state and dissipation in (formula presented) thin films",

abstract = "The temperature dependence of current-voltage (formula presented) thin films has been studied at different magnetic fields (H) and angles (formula presented) show critical scaling indicative of vortex glass transition. The critical exponents are found to be independent of H and (formula presented) indicating a universal behavior. The scaling functions are also seen to be field and angle independent when resistivity and current density are normalized with two parameters (formula presented) Field and angle dependences of parameters (formula presented) and vortex glass transition temperature (formula presented) are seen to be in agreement with the anisotropic Ginzburg-Landau model.",

author = "Gupta, \{S. K.\} and Shashwati Sen and Ajay Singh and Aswal, \{D. K.\} and Yakhmi, \{J. V.\} and Choi, \{Eun Mi\} and Kim, \{Hyun Jung\} and Kim, \{Kijoon H.P.\} and Seungje Choi and Lee, \{Hyun Sook\} and Kang, \{W. N.\} and Lee, \{Sung Ik\}",

year = "2002",

doi = "10.1103/PhysRevB.66.104525",

language = "English",

volume = "66",

pages = "1--5",

journal = "Physical Review B - Condensed Matter and Materials Physics",

issn = "1098-0121",

publisher = "American Physical Society",

number = "10",

}

Gupta, SK, Sen, S, Singh, A, Aswal, DK, Yakhmi, JV, Choi, EM, Kim, HJ, Kim, KHP, Choi, S, Lee, HS, Kang, WN & Lee, SI 2002, '(formula presented) characteristic measurements to study the nature of the vortex state and dissipation in (formula presented) thin films', Physical Review B - Condensed Matter and Materials Physics, vol. 66, no. 10, pp. 1-5. https://doi.org/10.1103/PhysRevB.66.104525

TY - JOUR

T1 - (formula presented) characteristic measurements to study the nature of the vortex state and dissipation in (formula presented) thin films

AU - Gupta, S. K.

AU - Sen, Shashwati

AU - Singh, Ajay

AU - Aswal, D. K.

AU - Yakhmi, J. V.

AU - Choi, Eun Mi

AU - Kim, Hyun Jung

AU - Kim, Kijoon H.P.

AU - Choi, Seungje

AU - Lee, Hyun Sook

AU - Kang, W. N.

AU - Lee, Sung Ik

PY - 2002

Y1 - 2002

N2 - The temperature dependence of current-voltage (formula presented) thin films has been studied at different magnetic fields (H) and angles (formula presented) show critical scaling indicative of vortex glass transition. The critical exponents are found to be independent of H and (formula presented) indicating a universal behavior. The scaling functions are also seen to be field and angle independent when resistivity and current density are normalized with two parameters (formula presented) Field and angle dependences of parameters (formula presented) and vortex glass transition temperature (formula presented) are seen to be in agreement with the anisotropic Ginzburg-Landau model.

AB - The temperature dependence of current-voltage (formula presented) thin films has been studied at different magnetic fields (H) and angles (formula presented) show critical scaling indicative of vortex glass transition. The critical exponents are found to be independent of H and (formula presented) indicating a universal behavior. The scaling functions are also seen to be field and angle independent when resistivity and current density are normalized with two parameters (formula presented) Field and angle dependences of parameters (formula presented) and vortex glass transition temperature (formula presented) are seen to be in agreement with the anisotropic Ginzburg-Landau model.

UR - https://www.scopus.com/pages/publications/85038318248

U2 - 10.1103/PhysRevB.66.104525

DO - 10.1103/PhysRevB.66.104525

M3 - Article

AN - SCOPUS:85038318248

SN - 1098-0121

VL - 66

SP - 1

EP - 5

JO - Physical Review B - Condensed Matter and Materials Physics

JF - Physical Review B - Condensed Matter and Materials Physics

IS - 10

ER -

(formula presented) characteristic measurements to study the nature of the vortex state and dissipation in (formula presented) thin films

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