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Formation of high flux parallel neutral beam using a three grid system of ion beam during low angle forward reflection of ions

  • Byoung Jae Park
  • , Kyoung Seok Min
  • , Sang Duk Park
  • , Jeong Woon Bae
  • , Oleksiy Vozniy
  • , Geun Young Yeom
  • Sungkyunkwan University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The energy and the flux of the ion gun with a three-grid system was compared with those of the ion gun with a two-grid system and the characteristics of the neutral beam sources composed of the ion guns with different grid systems and a reflector for the low angle reflection of the ions were investigated. By using the three-grid system instead of the two-grid system and by applying higher negative voltage to the 2nd grid, a higher ion flux without changing the ion energy could be obtained for the ion gun of the neutral beam source. The three-grid ion gun system generated higher neutral beam fluxes compared to the two-grid ion gun system. This result was confirmed by measuring the etch rates of Si and GaAs with Ar and fluorine neutral beam. Also, using the neutral beam source with the three-grid ion gun, 35nm-width Si patterns could be etched vertically by CF4 gas indicating the formation of a parallel neutral beam.

Original languageEnglish
Title of host publicationAdvances in Nanomaterials and Processing - IUMRS - ICA - 2006 International Conference in Asia
PublisherTrans Tech Publications Ltd
Pages275-278
Number of pages4
EditionPART 1
ISBN (Print)3908451310, 9783908451310
DOIs
StatePublished - 2007
EventIUMRS International Conference in Asia 2006, IUMRS-ICA 2006 - Jeju, Korea, Republic of
Duration: 10 Sep 200614 Sep 2006

Publication series

NameSolid State Phenomena
NumberPART 1
Volume124-126
ISSN (Print)1012-0394

Conference

ConferenceIUMRS International Conference in Asia 2006, IUMRS-ICA 2006
Country/TerritoryKorea, Republic of
CityJeju
Period10/09/0614/09/06

Keywords

  • Grid system
  • High beam flux
  • Low energy
  • Nano-scale etch
  • Neutral beam etching

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