Ferroelectricity in ultrathin PbZrO3/PbTiO3 artificial superlattices by scanning probe microscopy

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Abstract

We have studied ferroelectricity in ultrathin (down to 5 nm) PbZrO 3 /PbTiO 3 artificial superlattice by scanning probe microscopy (SPM). Synchrotron x-ray diffraction patterns showed only (00l) reflections. The average c-axis lattice parameters decreased with decreasing film thickness from 20 nm down to 5 nm along with the decrease in piezoresponse signal. By means of piezoresponse images and d 33 hysteresis measurement using piezoresponse force microscope (PFM), we demonstrated that the atomically smooth superlattices showed the uniform polarized domain patterns and ferroelectric polarization switching. The results reveal that the superlattice retains a stable ferroelectricity down to 5 nm thickness, although with a reduced piezoresponse signal.

Original languageEnglish
Pages (from-to)271-277
Number of pages7
JournalFerroelectrics
Volume336
DOIs
StatePublished - 1 Jul 2006

Keywords

  • Artificial lattices
  • Ferroelectricity
  • PbZrO/PbTiO
  • PFM
  • Size effect
  • SPM
  • Ultrathin

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