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Fabrication of metallic nano-protrusion for a recording mark

  • Jun Ho Kim
  • , J. Jeong
  • , J. Kim
  • , Mun Seok Jeong
  • Incheon National University
  • Gwangju Institute of Science and Technology

Research output: Contribution to journalArticlepeer-review

Abstract

We fabricated nano-protrusions on metallic multilayers by nano-oxidation with atomic force microscope (AFM). Two types of multilayers, namely Ti/Au/Ti and Ti/Ag/Ti were prepared, where the thickness of each layer was below ∼10 nm. For the fabricated samples, we obtained near-field scanning optical microscope (NSOM) images. With the NSOM image, we examined the light-intensity ratio of nano-protrusion to background and found that the light-intensity ratio was increased only in the Ti/Au/Ti sample. This result might be attributed to the resonant coupling of surface plasmon (SP) to the incident light from the NSOM tip, which was consistent with the results of transmittance spectra.

Original languageEnglish
Pages (from-to)S229-S232
JournalJournal of the Korean Physical Society
Volume47
Issue numberSUPPL. 1
StatePublished - Aug 2005
Externally publishedYes

Keywords

  • Nano-protrusion
  • NSOM
  • Optical memory
  • Surface plasmon

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