Fabrication of isolated ferroelectric domains in nano-scale

Won Ku Jung; Young Soo Choi; Changdeuck Bae; Bong Ki Lee; Seung Hyun Kim; Hyunjung Shin

doi:10.1080/714950502

Fabrication of isolated ferroelectric domains in nano-scale

Won Ku Jung, Young Soo Choi, Changdeuck Bae, Bong Ki Lee, Seung Hyun Kim, Hyunjung Shin

Research output: Contribution to journal › Article › peer-review

Abstract

Lead zirconate titanate (PZT) thin films were prepared by a sol-gel method on platinized Si. Their microstructure and surface morphology were characterized by XRD and AFM. Phase transformations of the prepared PZT films from pyrochlore to ferroelectric were observed at 550 and 600°C for furnace and RTF annealing, respectively. Smaller scattering angle (2°) XRD results showed more pyrochlore phases in the near surfaces and PZT (100) nucleated in Pt substrate and transformed to the surfaces in FA annealing PZT films. Isolated ferroelectric phases in the surroundings of pyrochlore phases were fabricated in order to study size effect of laterally confined ferroelectric domains. The isolated ferroelectric phases in the diameter of about 400 nm were found in FA PZT films at 450°C. Piezoresponse mode of AFM shows complex ferroelectric domains in the isolated phase, not from the surroundings.

Original language	English
Pages (from-to)	1521-1527
Number of pages	7
Journal	Integrated Ferroelectrics
Volume	59
DOIs	https://doi.org/10.1080/714950502
State	Published - 2003
Externally published	Yes

Keywords

Atomic force microscopy
Isolated ferroelectric domains
Microstructure evolution
Piezoelectric thin films

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10.1080/714950502

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@article{daf6cd3d017a43b2a81b2426d065a90c,

title = "Fabrication of isolated ferroelectric domains in nano-scale",

abstract = "Lead zirconate titanate (PZT) thin films were prepared by a sol-gel method on platinized Si. Their microstructure and surface morphology were characterized by XRD and AFM. Phase transformations of the prepared PZT films from pyrochlore to ferroelectric were observed at 550 and 600°C for furnace and RTF annealing, respectively. Smaller scattering angle (2°) XRD results showed more pyrochlore phases in the near surfaces and PZT (100) nucleated in Pt substrate and transformed to the surfaces in FA annealing PZT films. Isolated ferroelectric phases in the surroundings of pyrochlore phases were fabricated in order to study size effect of laterally confined ferroelectric domains. The isolated ferroelectric phases in the diameter of about 400 nm were found in FA PZT films at 450°C. Piezoresponse mode of AFM shows complex ferroelectric domains in the isolated phase, not from the surroundings.",

keywords = "Atomic force microscopy, Isolated ferroelectric domains, Microstructure evolution, Piezoelectric thin films",

author = "Jung, \{Won Ku\} and Choi, \{Young Soo\} and Changdeuck Bae and Lee, \{Bong Ki\} and Kim, \{Seung Hyun\} and Hyunjung Shin",

year = "2003",

doi = "10.1080/714950502",

language = "English",

volume = "59",

pages = "1521--1527",

journal = "Integrated Ferroelectrics",

issn = "1058-4587",

publisher = "Taylor and Francis Ltd.",

}

TY - JOUR

T1 - Fabrication of isolated ferroelectric domains in nano-scale

AU - Jung, Won Ku

AU - Choi, Young Soo

AU - Bae, Changdeuck

AU - Lee, Bong Ki

AU - Kim, Seung Hyun

AU - Shin, Hyunjung

PY - 2003

Y1 - 2003

N2 - Lead zirconate titanate (PZT) thin films were prepared by a sol-gel method on platinized Si. Their microstructure and surface morphology were characterized by XRD and AFM. Phase transformations of the prepared PZT films from pyrochlore to ferroelectric were observed at 550 and 600°C for furnace and RTF annealing, respectively. Smaller scattering angle (2°) XRD results showed more pyrochlore phases in the near surfaces and PZT (100) nucleated in Pt substrate and transformed to the surfaces in FA annealing PZT films. Isolated ferroelectric phases in the surroundings of pyrochlore phases were fabricated in order to study size effect of laterally confined ferroelectric domains. The isolated ferroelectric phases in the diameter of about 400 nm were found in FA PZT films at 450°C. Piezoresponse mode of AFM shows complex ferroelectric domains in the isolated phase, not from the surroundings.

AB - Lead zirconate titanate (PZT) thin films were prepared by a sol-gel method on platinized Si. Their microstructure and surface morphology were characterized by XRD and AFM. Phase transformations of the prepared PZT films from pyrochlore to ferroelectric were observed at 550 and 600°C for furnace and RTF annealing, respectively. Smaller scattering angle (2°) XRD results showed more pyrochlore phases in the near surfaces and PZT (100) nucleated in Pt substrate and transformed to the surfaces in FA annealing PZT films. Isolated ferroelectric phases in the surroundings of pyrochlore phases were fabricated in order to study size effect of laterally confined ferroelectric domains. The isolated ferroelectric phases in the diameter of about 400 nm were found in FA PZT films at 450°C. Piezoresponse mode of AFM shows complex ferroelectric domains in the isolated phase, not from the surroundings.

KW - Atomic force microscopy

KW - Isolated ferroelectric domains

KW - Microstructure evolution

KW - Piezoelectric thin films

UR - https://www.scopus.com/pages/publications/33751299781

U2 - 10.1080/714950502

DO - 10.1080/714950502

M3 - Article

AN - SCOPUS:33751299781

SN - 1058-4587

VL - 59

SP - 1521

EP - 1527

JO - Integrated Ferroelectrics

JF - Integrated Ferroelectrics

ER -

Fabrication of isolated ferroelectric domains in nano-scale

Abstract

Keywords

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