Fabrication of an electronic test platform containing nano via holes for molecular devices

Do Hyun Kim, Chung Kun Song, Yongku Kang, Changjin Lee, Hyoyoung Lee, Hye Mi So, Jinhee Kim

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

In this paper, a simple device structure is proposed as an electronic test platform for characterizing the electrical properties of molecules. It consists of nano via holes containing active molecules inside. The nano via holes are formed in a background insulating layer sandwiched between bottom and top Ti/Au contacts. The fabrication process is described in detail. The reliability of the device structure and the fabrication process was tested by comparing the I-V characteristics of a self-assembled dodecanethiol monolayer in a nano via hole with the published result.

Original languageEnglish
Pages (from-to)983-987
Number of pages5
JournalJournal of the Korean Physical Society
Volume45
Issue number4
StatePublished - Oct 2004
Externally publishedYes

Keywords

  • Molecular device
  • Nano device
  • Self-assembled monolayer

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