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Extraction technique for intrinsic subgap DOS in a-IGZO TFTs by de-embedding the parasitic capacitance through the photonic C-V measurement

  • Hagyoul Bae
  • , Hyunjun Choi
  • , Saeroonter Oh
  • , Dae Hwan Kim
  • , Jonguk Bae
  • , Jaehyeong Kim
  • , Yun Hyeok Kim
  • , Dong Myong Kim
  • Kookmin University
  • LG Corporation

Research output: Contribution to journal › Article › peer-review

25   Link opens in a new tab Scopus citations

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