@inproceedings{8bbbdf06f5ba4f0197aa087c53341449,
title = "Experimental decomposition of the positive bias temperature stress-induced instability in self-aligned coplanar InGaZnO thin-film transistors and its modeling based on the multiple stretched-exponential functions",
abstract = "Decomposition of the positive gate-bias temperature stress (PBTS)-induced instability into contributions of distinct mechanisms is experimentally demonstrated in top-gate self-aligned coplanar amorphous InGaZnO thin-film transistors and validated by reproducing the PBTS time-evolution of l-V characteristics through the TCAD simulation into which the extracted density-of-states and charge trapping are incorporated.",
keywords = "Amorphous InGaZno thin-film transistors, Experimental decomposition of positive-bias temperature stress instability, Top-gate self-aligned coplanar structure",
author = "Kim, \{Dae Hwan\} and Sungju Choi and Juntae Jang and Hara Kang and Kim, \{Dong Myong\} and Choi, \{Sung Jin\} and Kim, \{Yong Sung\} and Saeroonter Oh and Baeck, \{Ju Heyuck\} and \{Uk Bae\}, Jong and Park, \{Kwon Shik\} and Yoon, \{Soo Young\} and Kang, \{In Byeong\}",
note = "Publisher Copyright: {\textcopyright} (2017) by SID-the Society for Information Display. All rights reserved.; SID Symposium, Seminar, and Exhibition 2017, Display Week 2017 ; Conference date: 21-05-2017 Through 26-05-2017",
year = "2017",
doi = "10.1002/jsid.531",
language = "English",
series = "Digest of Technical Papers - SID International Symposium",
publisher = "Blackwell Publishing Ltd",
number = "1",
pages = "298--301",
booktitle = "Digest of Technical Papers - SID International Symposium",
edition = "1",
}