Erratum: Correction to aging dynamics of solution-processed amorphous oxide semiconductor field effect transistors (ACS Applied Materials and Interfaces)

Changdeuck Bae; Dongjo Kim; Sunmi Moon; Taeyoung Choi; Youngmin Kim; Bo Sung Kim; Jang Sik Lee; Hyunjung Shin; Jooho Moon

doi:10.1021/am100216q

Erratum: Correction to aging dynamics of solution-processed amorphous oxide semiconductor field effect transistors (ACS Applied Materials and Interfaces)

Changdeuck Bae
, Dongjo Kim
, Sunmi Moon
, Taeyoung Choi
, Youngmin Kim
, Bo Sung Kim
, Jang Sik Lee
, Hyunjung Shin
, Jooho Moon

Department of Energy

Research output: Contribution to journal › Comment/debate

Original language	English
Pages (from-to)	1273
Number of pages	1
Journal	ACS Applied Materials and Interfaces
Volume	2
Issue number	4
DOIs	https://doi.org/10.1021/am100216q
State	Published - 28 Apr 2010

Access to Document

10.1021/am100216q

Cite this

@article{a88c8960e0c84cc1978bc34c62d894f8,

title = "Erratum: Correction to aging dynamics of solution-processed amorphous oxide semiconductor field effect transistors (ACS Applied Materials and Interfaces)",

author = "Changdeuck Bae and Dongjo Kim and Sunmi Moon and Taeyoung Choi and Youngmin Kim and Kim, \{Bo Sung\} and Lee, \{Jang Sik\} and Hyunjung Shin and Jooho Moon",

year = "2010",

month = apr,

day = "28",

doi = "10.1021/am100216q",

language = "English",

volume = "2",

pages = "1273",

journal = "ACS Applied Materials and Interfaces",

issn = "1944-8244",

publisher = "American Chemical Society",

number = "4",

}

TY - JOUR

T1 - Erratum

T2 - Correction to aging dynamics of solution-processed amorphous oxide semiconductor field effect transistors (ACS Applied Materials and Interfaces)

AU - Bae, Changdeuck

AU - Kim, Dongjo

AU - Moon, Sunmi

AU - Choi, Taeyoung

AU - Kim, Youngmin

AU - Kim, Bo Sung

AU - Lee, Jang Sik

AU - Shin, Hyunjung

AU - Moon, Jooho

PY - 2010/4/28

Y1 - 2010/4/28

UR - https://www.scopus.com/pages/publications/79151485276

U2 - 10.1021/am100216q

DO - 10.1021/am100216q

M3 - Comment/debate

AN - SCOPUS:79151485276

SN - 1944-8244

VL - 2

SP - 1273

JO - ACS Applied Materials and Interfaces

JF - ACS Applied Materials and Interfaces

IS - 4

ER -

Erratum: Correction to aging dynamics of solution-processed amorphous oxide semiconductor field effect transistors (ACS Applied Materials and Interfaces)

Access to Document

Other files and links

Cite this