Erratum: A comparative analysis of deep level emission in ZnO layers deposited by various methods (Journal of Applied Physics (2009) 105 (013502))

Cheol Hyoun Ahn; Young Yi Kim; Dong Chan Kim; Sanjay Kumar Mohanta; Hyung Koun Cho

doi:10.1063/1.3112042

Erratum: A comparative analysis of deep level emission in ZnO layers deposited by various methods (Journal of Applied Physics (2009) 105 (013502))

Cheol Hyoun Ahn
, Young Yi Kim
, Dong Chan Kim
, Sanjay Kumar Mohanta
, Hyung Koun Cho

Department of Advanced Materials Science and Engineering

Sungkyunkwan University

Research output: Contribution to journal › Comment/debate

57 Scopus citations

Original language	English
Article number	089902
Journal	Journal of Applied Physics
Volume	105
Issue number	8
DOIs	https://doi.org/10.1063/1.3112042
State	Published - 2009

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10.1063/1.3112042

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AU - Mohanta, Sanjay Kumar

AU - Cho, Hyung Koun

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Erratum: A comparative analysis of deep level emission in ZnO layers deposited by various methods (Journal of Applied Physics (2009) 105 (013502))

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