Epitaxial ferroelectric Pb(Mg1/3Nb2/3)O 3-PbTiO3 thin films on La0.7Sr 0.3MnO3 bottom electrode

A. Chopra; E. Panda; Y. Kim; M. Arredondo; D. Hesse

doi:10.1007/s10832-014-9936-y

Epitaxial ferroelectric Pb(Mg_1/3Nb_2/3)O ₃-PbTiO₃ thin films on La_0.7Sr _0.3MnO₃ bottom electrode

A. Chopra
, E. Panda
, Y. Kim
, M. Arredondo
, D. Hesse

Department of Advanced Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

Epitaxial (001)-oriented 0.7Pb(Mg_0.33Nb_0.67)O ₃-0.3PbTiO₃ (PMN-PT) thin films were deposited by pulsed laser deposition on vicinal SrTiO₃ (001) substrates using La _0.7Sr_0.3MnO₃ as bottom electrode. Detailed microstructural investigations of these films were carried out using X-ray diffraction (XRD), atomic force microscopy (AFM) and transmission electron microscopy (TEM). Polarization-field hysteresis curves were measured at room temperature. Spontaneous polarization P _s, remnant polarization P _r and coercive voltage V _c were found to be 25 μC/cm², 15 μC/cm² and 0.81 V, respectively. Field dependent dielectric constant measurements exhibited butterfly shaped curves, indicating the true ferroelectric nature of these films at room temperature. The dielectric constant and the dielectric loss at 100 kHz were found to be 238 and 0.14, respectively. The local piezoelectric properties of PMN-PT films were investigated by piezoelectric force microscopy and were found to exhibit a local piezoelectric coefficient of 7.8 pm/V.

Original language	English
Pages (from-to)	404-408
Number of pages	5
Journal	Journal of Electroceramics
Volume	32
Issue number	4
DOIs	https://doi.org/10.1007/s10832-014-9936-y
State	Published - Jun 2014

Keywords

Dielectric properties
Epitaxial growth
Ferroelectricity
Thin films

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10.1007/s10832-014-9936-y

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title = "Epitaxial ferroelectric Pb(Mg1/3Nb2/3)O 3-PbTiO3 thin films on La0.7Sr 0.3MnO3 bottom electrode",

abstract = "Epitaxial (001)-oriented 0.7Pb(Mg0.33Nb0.67)O 3-0.3PbTiO3 (PMN-PT) thin films were deposited by pulsed laser deposition on vicinal SrTiO3 (001) substrates using La 0.7Sr0.3MnO3 as bottom electrode. Detailed microstructural investigations of these films were carried out using X-ray diffraction (XRD), atomic force microscopy (AFM) and transmission electron microscopy (TEM). Polarization-field hysteresis curves were measured at room temperature. Spontaneous polarization P s, remnant polarization P r and coercive voltage V c were found to be 25 μC/cm2, 15 μC/cm2 and 0.81 V, respectively. Field dependent dielectric constant measurements exhibited butterfly shaped curves, indicating the true ferroelectric nature of these films at room temperature. The dielectric constant and the dielectric loss at 100 kHz were found to be 238 and 0.14, respectively. The local piezoelectric properties of PMN-PT films were investigated by piezoelectric force microscopy and were found to exhibit a local piezoelectric coefficient of 7.8 pm/V.",

keywords = "Dielectric properties, Epitaxial growth, Ferroelectricity, Thin films",

author = "A. Chopra and E. Panda and Y. Kim and M. Arredondo and D. Hesse",

year = "2014",

month = jun,

doi = "10.1007/s10832-014-9936-y",

language = "English",

volume = "32",

pages = "404--408",

journal = "Journal of Electroceramics",

issn = "1385-3449",

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TY - JOUR

T1 - Epitaxial ferroelectric Pb(Mg1/3Nb2/3)O 3-PbTiO3 thin films on La0.7Sr 0.3MnO3 bottom electrode

AU - Chopra, A.

AU - Panda, E.

AU - Kim, Y.

AU - Arredondo, M.

AU - Hesse, D.

PY - 2014/6

Y1 - 2014/6

N2 - Epitaxial (001)-oriented 0.7Pb(Mg0.33Nb0.67)O 3-0.3PbTiO3 (PMN-PT) thin films were deposited by pulsed laser deposition on vicinal SrTiO3 (001) substrates using La 0.7Sr0.3MnO3 as bottom electrode. Detailed microstructural investigations of these films were carried out using X-ray diffraction (XRD), atomic force microscopy (AFM) and transmission electron microscopy (TEM). Polarization-field hysteresis curves were measured at room temperature. Spontaneous polarization P s, remnant polarization P r and coercive voltage V c were found to be 25 μC/cm2, 15 μC/cm2 and 0.81 V, respectively. Field dependent dielectric constant measurements exhibited butterfly shaped curves, indicating the true ferroelectric nature of these films at room temperature. The dielectric constant and the dielectric loss at 100 kHz were found to be 238 and 0.14, respectively. The local piezoelectric properties of PMN-PT films were investigated by piezoelectric force microscopy and were found to exhibit a local piezoelectric coefficient of 7.8 pm/V.

AB - Epitaxial (001)-oriented 0.7Pb(Mg0.33Nb0.67)O 3-0.3PbTiO3 (PMN-PT) thin films were deposited by pulsed laser deposition on vicinal SrTiO3 (001) substrates using La 0.7Sr0.3MnO3 as bottom electrode. Detailed microstructural investigations of these films were carried out using X-ray diffraction (XRD), atomic force microscopy (AFM) and transmission electron microscopy (TEM). Polarization-field hysteresis curves were measured at room temperature. Spontaneous polarization P s, remnant polarization P r and coercive voltage V c were found to be 25 μC/cm2, 15 μC/cm2 and 0.81 V, respectively. Field dependent dielectric constant measurements exhibited butterfly shaped curves, indicating the true ferroelectric nature of these films at room temperature. The dielectric constant and the dielectric loss at 100 kHz were found to be 238 and 0.14, respectively. The local piezoelectric properties of PMN-PT films were investigated by piezoelectric force microscopy and were found to exhibit a local piezoelectric coefficient of 7.8 pm/V.

KW - Dielectric properties

KW - Epitaxial growth

KW - Ferroelectricity

KW - Thin films

UR - https://www.scopus.com/pages/publications/84905262947

U2 - 10.1007/s10832-014-9936-y

DO - 10.1007/s10832-014-9936-y

M3 - Article

AN - SCOPUS:84905262947

SN - 1385-3449

VL - 32

SP - 404

EP - 408

JO - Journal of Electroceramics

JF - Journal of Electroceramics

IS - 4

ER -

Epitaxial ferroelectric Pb(Mg_1/3Nb_2/3)O ₃-PbTiO₃ thin films on La_0.7Sr _0.3MnO₃ bottom electrode

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Keywords

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