Enhancing the mobility of p-type SnOx thin-film transistors through doping and plasma treatment

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Abstract

P-type semiconductors are less common than their n-type counterparts, and their performance often lags in comparison, which hinders the efficiency of electronic devices. In this study, we demonstrate a two-step approach to enhance the performance of tin oxide based thin-film transistors (TFTs) by combining aluminum (Al) doping and hydrogen plasma treatment. The Al doping significantly enhanced the field-effect mobility of the SnOx films, while the hydrogen plasma treatment enabled the transition to p-type conductivity. The fabricated p-type Al-doped SnOx TFTs exhibited a threshold voltage of −5.2 V, a field-effect mobility of 1.17 cm2/V·s, and Ion/Ioff of 105. This work provides a novel strategy for optimizing the performance of p-type SnOx semiconductors, contributing to the development of low-power complementary metal-oxide semiconductor (CMOS) technologies.

Original languageEnglish
Article number109181
JournalSolid-State Electronics
Volume229
DOIs
StatePublished - Nov 2025

Keywords

  • CMOS
  • Doping
  • Simulation
  • Thin film transistor
  • Tin oxide

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