Abstract
PbZrO 3 (PZO)/PbTiO 3 (PTO) artificial superlattices have been grown on La 0.5Sr 0.5CoO 3 (LSCO) (100)/MgO (100) substrate by pulsed laser deposition with various stacking periods from 1 to 100 unit cells. The PZO/PTO artificial lattice exhibited a diffraction pattern characteristic of a superlattice structure, i.e., a main diffraction peak with satellite peaks. The electrical properties of the superlattices were investigated as a function of the stacking period. The dielectric constant and remnant polarization improved on decreasing the stacking periodicity. The dielectric constant of the superlattice reached 800 at a stacking period of lunit cell/lunit cell (PZO 1/PTO 1), which is larger than that of the single PZT solid-solution film. Moreover, the remnant polarization reached a maximum, 2Pr = 38.7 μC/cm 2, at a 2-unit-cell stacking period. Progressive enhancement of dielectric constant and remnant polarization in artificial PZO/PTO superlattice was accompanied by expansion of the (100)-plane spacing on decreasing the stacking periodicity. These results suggest that the lattice strain developed in the PZO/PTO superlattice may have influence on dielectric constant and ferroelectric behavior.
| Original language | English |
|---|---|
| Pages (from-to) | 116-119 |
| Number of pages | 4 |
| Journal | Journal of the Korean Physical Society |
| Volume | 46 |
| Issue number | 1 |
| State | Published - Jan 2005 |
Keywords
- Dielectric constant
- Lattice strain
- PbZrO /PbTiO artificial superlattices
- Pulsed laser deposition
- Remnant polarization