Abstract
In this paper, we present a set of methodologies to model the electromagnetic susceptibility (EMS) testing of I/O buffers for mobile system memory based on the bulk current injection (BCI) method. An efficient equivalent circuit model is developed for the current injection probe, line impedance stabilization network (LISN), printed circuit board (PCB), and package. The simulation results show good correlation with the measurements and thus, the work presented here will enable electromagnetic susceptibility analysis at the integrated circuit (IC) design stage.
| Original language | English |
|---|---|
| Pages (from-to) | 114-126 |
| Number of pages | 13 |
| Journal | Journal of Semiconductor Technology and Science |
| Volume | 13 |
| Issue number | 2 |
| DOIs | |
| State | Published - Apr 2013 |
Keywords
- Bulk current injection (BCI)
- Electromagnetic compatibility (EMC)
- Electromagnetic susceptibility (EMS)
- I/O buffer
- Injection probe
- On-chip decoupling capacitor
- On-chip power grid
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