TY - GEN
T1 - Electromagnetic susceptibility analysis of ICs using DPI method with consideration of PDN
AU - Pu, Bo
AU - Lee, Jae Joong
AU - Kwak, Sang Keun
AU - Kim, So Young
AU - Nah, Wansoo
PY - 2012
Y1 - 2012
N2 - This paper predicts electromagnetic susceptibility (EMS) of integrated circuits (ICs) with novel consideration of complex power distribution network (PDN). For accurate simulation performance, the set-up model is derived in detail, especially the PDN. PDN model is extracted from the physical configuration and also in view of the function of system to express the ground bounce exactly since it is a pivot factor in DPI test for EMS. After measurement, comparison with simulation result is applied to validate the proposed model and estimate the electromagnetic susceptibility of ICs.
AB - This paper predicts electromagnetic susceptibility (EMS) of integrated circuits (ICs) with novel consideration of complex power distribution network (PDN). For accurate simulation performance, the set-up model is derived in detail, especially the PDN. PDN model is extracted from the physical configuration and also in view of the function of system to express the ground bounce exactly since it is a pivot factor in DPI test for EMS. After measurement, comparison with simulation result is applied to validate the proposed model and estimate the electromagnetic susceptibility of ICs.
UR - https://www.scopus.com/pages/publications/84864847704
U2 - 10.1109/APEMC.2012.6237980
DO - 10.1109/APEMC.2012.6237980
M3 - Conference contribution
AN - SCOPUS:84864847704
SN - 9781457715587
T3 - cccc2012 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2012 - Proceedings
SP - 77
EP - 80
BT - 2012 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2012 - Proceedings
T2 - 2012 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2012
Y2 - 21 May 2012 through 24 May 2012
ER -