Electromagnetic interference shielding effectiveness of sputtered NiFe/Cu multi-layer thin film at high frequencies
- Jong Hwan Park
- , Jung Woo Lee
- , Ho Jun Choi
- , Won Gyu Jang
- , Tae Sung Kim
- , Dae Seok Suh
- , Han Young Jeong
- , Seo Young Chang
- , Jae Chul Roh
- , Chan Sei Yoo
- , Ki Hyeon Kim
- , Chan Park
- , Su Jeong Suh
- Sungkyunkwan University
- Yeungnam University
- Samsung
- Korea Electronics Technology Institute
- Pukyong National University
Research output: Contribution to journal › Article › peer-review
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