Electrical properties of charging effect in Au nanoparticle memory device

Semiconductors or metal nanoparticles (NPs) using their monolayer bindings with self-assembly chemicals are an attractive topic for device researchers. Electrical performance of such structures can be investigated for a particular application, such as memory device. Currently, Au NPs has been reported to show a substantial potential in the memory applications. In this study, Au NP and gluing layer were fabricated through a new method of monolayer formation of a chemical bonding or gluing. In this study, a new NPs memory system was fabricated by using organic semiconductor, i.e., pentacene as the active layer, evaporated Au as electrode, SiO₂ as the gate insulator layer on silicon wafer. In addition, Au NPs coated with binding chemicals were used as charge storage elements on an APTES (3-amino-propyltriethoxysilane) as a gluing layer. In order to investigate chemical binding of Au NP to the gate insulator layer, GPTMS (3-glycidoxy-propyltrimethoxysilane) were coated on the Au NPs. As a result of that, a layer of gold nanoparticles has been incorporated into a metal-pentacene-insulator-semiconductor (MPIS) structure. The MPIS device with the Au NP exhibited a hysteresis in its capacitance versus voltage analysis. Charge storage in the layer of nanoparticles is thought to be responsible for this effect.