Effects of thermal and electrical stress on defect generation in InAs metal–oxide–semiconductor capacitor
- Min Baik
- , Hang Kyu Kang
- , Yu Seon Kang
- , Kwang Sik Jeong
- , Changmin Lee
- , Hyoungsub Kim
- , Jin Dong Song
- , Mann Ho Cho
- Yonsei University
- Korea Institute of Science and Technology
- Samsung
- Sungkyunkwan University
Research output: Contribution to journal › Article › peer-review
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