Effects of plasma process induced damages on organic gate dielectrics of organic thin-film transistors
- Doo Hyun Kim
- , Dong Woo Kim
- , Keon Soo Kim
- , Hyoung Jin Kim
- , Ji Sun Moon
- , Mun Pyo Hong
- , Bo Sung Kim
- , Jung Han Shin
- , Young Min Kim
- , Keun Kyu Song
- , Seong Sik Shin
- Korea University
- Samsung
Research output: Contribution to journal › Article › peer-review
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