Effects of oxygen radical on the properties of indium tin oxide thin films deposited at room temperature by oxygen ion beam assisted evaporation
- J. S. Kim
- , J. W. Bae
- , H. J. Kim
- , N. E. Lee
- , G. Y. Yeom
- , K. H. Oh
Research output: Contribution to journal › Article › peer-review
34
Link opens in a new tab
Scopus
citations